Structural and spectroscopic ellipsometry studies on vacuum-evaporated Sn2m−4Sb4S2m+2 (m = 2.5, 3 and 4) thin films deposited on glass and Si substrates

Abdelkader, D.; Akkari, F. Chaffar; Khémiri, N.; Gallas, Bruno; Antoni, F.; Kanzari, M.

doi:10.1016/j.jallcom.2015.06.114

Cited by 11 publications

(4 citation statements)

References 40 publications

(53 reference statements)

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“…The Cauchy parameters are classified in Table 3. We note that Sn 3 Sb 2 S 6 has the lower value of refractive index n. Hence it can be concluded from this work and the two previous works [34,38] that the refractive index of Sn 3 Sb 2 S 6 is still the…”

Section: Refractive Indices and Dispersion Analysissupporting

confidence: 70%

“…The effect of SnS addition is notable on the Raman spectra of the normally deposited films; the intensity of some peaks perceptibly increases, especially the one located at 94 cm -1 assigned to [SnS 4 ] tetrahedral unit [38]. This effect is not apparent in the spectra of the GLAD sample because the thickness affects the intensity and this is confirmed by Raman cartography.…”

Section: Fig4 (B)mentioning

confidence: 72%

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Effect of SnS addition on the morphological and optical properties of (SnS)m(Sb2S3)n nano-rods elaborated by glancing angle deposition

Abdelkader

Akkari

Khémiri

et al. 2018

Physica B: Condensed Matter

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(SnS) m (Sb 2 S 3) n thin films were prepared by thermal evaporation using the glancing angle deposition technique (GLAD). The incident angle between the particle flux and the normal to the substrate was fixed at 80°. The Raman and XRD characterization revealed the amorphous character of the films due to the columnar structure as shown by the SEM characterization and AFM analysis. A strong change of the surface morphology of the films was observed and it depends on the composition. Optical properties were extracted from transmittance T and reflectance R spectra. (SnS) m (Sb 2 S 3) n thin films exhibit high absorption coefficients (10 4-2×10 5 cm-1) in the visible range and the higher values were obtained for Sn 3 Sb 2 S 6 and it has the highest photocurrent values. The direct band gap (E g dir) was in the range 2.11-1.67 eV. The refractive indices are calculated from optical transmittance spectra of the films. The Sn 3 Sb 2 S 6 sample exhibits a lower refractive index. All the dispersion curves of refractive index match well with the Cauchy dispersion formula and they were analyzed using Wemple-DiDomenico model. The Bruggeman effective medium approximation EMA was used to calculate the packing density of different compositions, and SnSb 4 S 7 sample has the highest

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Section: Refractive Indices and Dispersion Analysissupporting

confidence: 70%

Section: Fig4 (B)mentioning

confidence: 72%

Effect of SnS addition on the morphological and optical properties of (SnS)m(Sb2S3)n nano-rods elaborated by glancing angle deposition

Abdelkader

Akkari

Khémiri

et al. 2018

Physica B: Condensed Matter

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“…The Sulfosalts Sn-Sb-S has been recently investigated in the field of photovoltaics, since research is directed towards the development of cost effective and non toxic materials that can be synthesized by a simple technology for solar cell fabrication. 8 They are characterized by a high reflectivity contrast, cyclability, long-term stability, and fast crystallization rate. 8 Due to the possibility of band gap engineering and the high absorption coefficient, thin film photovoltaic applications are of great interest.…”

Section: Introductionmentioning

confidence: 99%

“…8 They are characterized by a high reflectivity contrast, cyclability, long-term stability, and fast crystallization rate. 8 Due to the possibility of band gap engineering and the high absorption coefficient, thin film photovoltaic applications are of great interest. 9 Especially, Sn 3 Sb 2 S 6 material is studied.…”

Section: Introductionmentioning

confidence: 99%

Structural, Morphological and Optical Properties of Sn3Sb2S6 Thin Films Synthesized by Oblique Angle Deposition

Larbi

Akkari

Dahman

et al. 2016

Journal of Elec Materi

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The oblique angle deposition technique has attracted a lot attention in many different applications due to its unique advantage of programmable nanocolumns. In this work we use this technique to investigate the physical properties of obliquely thermal evaporated Sn 3 Sb 2 S 6 thin films deposited onto unheated glass and silicon substrates, inclined from the flux vapor source at the deposition angles 0°, 40°, 60°, 75°and 85°. X-ray diffraction (XRD) and UV-Visible and near infrared (UV-Vis-IFR) analysis were used respectively to characterize the structural and optical properties of the layers. The influence of flux angle on the surface morphology and the microstructure was investigated by using scanning electron microscopy. The optical constants were obtained from analysis of the experimental recorded transmission and reflectance spectral data over the wavelength range 300 nm to 1800 nm. The band gaps of the synthesized thin films were found to be direct allowed transitions and increased from 1.44 eV to 1.66 eV with increasing c from 0°to 85°, respectively. The absorption coefficients of the films are in the range of 10 5 cm À1 to 10 6 cm À1 . The refractive indexes were evaluated in the transparent region in terms of the envelope method suggested by the Swanepoel model. It has been found that the refractive index decreases from 2.66 to 2.06 with increasing deposition angle from 0°to 85°, respectively. The relationship between the flux incident angles c and the column angle b was also explored. The oblique angle deposition films showed an inclined columnar structure, with columns tilting in the direction of the incident flux. The effective packing densities of the synthesized Sn 3 Sb 2 S 6 thin films were calculated using Bruggeman effective medium approximation.

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Complexing Agent-Dependent Properties of Chemically Deposited Tin Antimony Sulphide Thin Films for Use in Sustainable Energy Devices

Nwofe

Sugiyama

2022

J. Electron. Mater.

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Structural and spectroscopic ellipsometry studies on vacuum-evaporated Sn2m−4Sb4S2m+2 (m = 2.5, 3 and 4) thin films deposited on glass and Si substrates

Cited by 11 publications

References 40 publications

Effect of SnS addition on the morphological and optical properties of (SnS)m(Sb2S3)n nano-rods elaborated by glancing angle deposition

Effect of SnS addition on the morphological and optical properties of (SnS)m(Sb2S3)n nano-rods elaborated by glancing angle deposition

Structural, Morphological and Optical Properties of Sn3Sb2S6 Thin Films Synthesized by Oblique Angle Deposition

Complexing Agent-Dependent Properties of Chemically Deposited Tin Antimony Sulphide Thin Films for Use in Sustainable Energy Devices

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