In this work, we report a simple way of copper oxide Cu 2 O elaboration, by first depositing copper using thermal vacuum evaporation at different substrate angles. This technique is known as GLAD (glancing angle deposition). In order to obtain the oxide phase, the copper nanostructures obtained were annealed in air at 523 K for 2 h. After air annealing, the films were characterized by x-ray diffraction, scanning electron microscopy, four-point probe method and UV-vis-NIR spectrophotometry. XRD study showed that Cu 2 O phase was obtained. The optical direct band gap energies for Cu 2 O films calculated from optical absorption measurements are between 2.45 and 2.54 eV. Optical and electrical anisotropy versus the incident angle of the Cu 2 O thin films were reported. An enhancement of the birefringence was observed for the incident angle around 60°. Electrical properties of the Cu 2 O films were investigated by AC impedance spectroscopy over a wide range of temperature up to 468 K starting from room temperature in the frequency range 5Hz-13 MHz. Nyquist diagrams of all samples display two semicircles that highlight the influences of single nanocrystals and grain boundaries and interface as well as porosity of samples. Impedance analysis showed that the resistance decreased by increasing temperature. Both analysis of AC and DC conductivities showed that the conduction mechanism was assured by hopping between localized states.