2014
DOI: 10.1134/s0030400x14110198
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Structural and photoluminescent properties of TiN thin films

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Cited by 6 publications
(2 citation statements)
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“…The edge-enhanced Raman spectrum is accompanied by fluorescence of TiN that ranges from 2.1 to 3.4 eV. 32 Structural defects of the crystal lattice, including donor states of the nitrogen vacancies, lead to radiative transitions from localized states within the forbidden band. Localized plasmon gap-modes can be easily visualized with the polarized TERS method.…”
Section: Nano Lettersmentioning
confidence: 99%
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“…The edge-enhanced Raman spectrum is accompanied by fluorescence of TiN that ranges from 2.1 to 3.4 eV. 32 Structural defects of the crystal lattice, including donor states of the nitrogen vacancies, lead to radiative transitions from localized states within the forbidden band. Localized plasmon gap-modes can be easily visualized with the polarized TERS method.…”
Section: Nano Lettersmentioning
confidence: 99%
“…An observable polarization dependence gives convincing evidence for SPP excitation on the resonator edges. The edge-enhanced Raman spectrum is accompanied by fluorescence of TiN that ranges from 2.1 to 3.4 eV . Structural defects of the crystal lattice, including donor states of the nitrogen vacancies, lead to radiative transitions from localized states within the forbidden band.…”
mentioning
confidence: 99%