Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005.
DOI: 10.1109/.2005.1469251
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Strain-induced very low noise RF MOSFETs on flexible plastic substrate

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Cited by 20 publications
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“…3. These results represent an improvement over the previous ICP etching and thinning process [2]- [3] since the CMP technique avoids plasma damage. Good device performance is indicated by a fT of 103 GHz for the 0.13 tm RF MOSFETs.…”
Section: Methodsmentioning
confidence: 71%
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“…3. These results represent an improvement over the previous ICP etching and thinning process [2]- [3] since the CMP technique avoids plasma damage. Good device performance is indicated by a fT of 103 GHz for the 0.13 tm RF MOSFETs.…”
Section: Methodsmentioning
confidence: 71%
“…The multiple-gate-finger structure was used to reduce the gate-resistance-generated thermal noise and the microstrip line layouts were designed using Metal-I as the ground plane to reduce the RF noise from the lossy Si substrate [3]. To achieve integration onto plastic, we first thinned down the Si substrate from 500 tm to 40 tm by using a Chemical Mechanical Polish (CMP) procedure.…”
Section: Methodsmentioning
confidence: 99%
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