2005
DOI: 10.1134/1.1992635
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Stimulation of negative magnetoresistance by an electric field and light in silicon doped with boron and manganese

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“…Having analyzed and summarizing the above experimental data one can tentatively assume that at direct switching mode of the diode structure, we are witnessing the so-called effect of negative photoconductivity due to the process of injection of current carriers associated with level E = 0.4 eV [8][9][10][11][12]. Under constant illumination, photoconductivity starts at Ei0.26 eV and decreases within the 0.4 eV range with a relatively sharp minimum at E  0.52 eV, where the effect of infrared quenching of photoconductivity occurs.…”
Section: Resultsmentioning
confidence: 99%
“…Having analyzed and summarizing the above experimental data one can tentatively assume that at direct switching mode of the diode structure, we are witnessing the so-called effect of negative photoconductivity due to the process of injection of current carriers associated with level E = 0.4 eV [8][9][10][11][12]. Under constant illumination, photoconductivity starts at Ei0.26 eV and decreases within the 0.4 eV range with a relatively sharp minimum at E  0.52 eV, where the effect of infrared quenching of photoconductivity occurs.…”
Section: Resultsmentioning
confidence: 99%
“…In such materials, the local electrical neutrality is absent and the system itself is in an extremely nonequilibrium state. The electrophysical and photoelectric properties of such materials essentially differ from weakly-compensated materials in which there are observed some new physical phenomena [2,3].…”
mentioning
confidence: 99%