2016
DOI: 10.1016/j.sna.2016.03.014
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Steel integrated thin film sensors for characterizing grinding processes

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Cited by 11 publications
(5 citation statements)
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“…Dumstorff et al (2016) developed thin film force sensors which were integrated with steel in order to characterize grinding operations [178]. Luo et al measured the cutting forces in the milling process by using work tables that were integrated with polyvinylidene fluoride (PVDF) [179]. Similarly, Liu et al (2019) evaluated the cutting forces of milling operation using thin film sensors that were fitted into fixtures [7].…”
Section: Force Sensorsmentioning
confidence: 99%
“…Dumstorff et al (2016) developed thin film force sensors which were integrated with steel in order to characterize grinding operations [178]. Luo et al measured the cutting forces in the milling process by using work tables that were integrated with polyvinylidene fluoride (PVDF) [179]. Similarly, Liu et al (2019) evaluated the cutting forces of milling operation using thin film sensors that were fitted into fixtures [7].…”
Section: Force Sensorsmentioning
confidence: 99%
“…Materials such as chromium are used to create thin-film sensors with a specific shape to allow measurement of the electrical resistance during changing external loads. Such sensors have been successfully applied in machining processes for temperature measurement of cutting inserts right on the rake face [6] as well as in grinding processes [7]. Novel application methods for the thin-film layer were studied in [8] and [9].…”
Section: Introductionmentioning
confidence: 99%
“…Although external loads such as forces affecting the workpiece during material processing can be measured and analyzed in detail (e.g., with force dynamometers), there is currently no in-process measuring method that is capable of determining the strains in the contact zone. Steel integrated thin film sensors to measure the mechanical loads in test workpieces during the manufacturing process are subject of current scientific research [7][8][9]. However, this measurement approach is invasive and currently only allows single-point measurements with a limited spatial resolution in the millimeter range.…”
Section: Introductionmentioning
confidence: 99%