Status of development of ECR ion sources at Grenoble (invited)

Melin, G.; Bourg, F.; Briand, P.; Delaunay, M.; Gaudart, G.; Girard, Alain; Hitz, D.; Klein, J. P.; Ludwig, Peter; Nguyen, Tram; Pontonnier, M.; Su, Yi‐Jiun

doi:10.1063/1.1145113

Cited by 14 publications

(1 citation statement)

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“…In a modified simulation, in which the contribution of secondary electrons from walls to the plasma is considered, the electron confinement time of 160 s can be reduced by at least a factor of 10 to maintain the otherwise same simulation parameters and to obtain identical simulation results. The importance of secondary electrons for the ECR plasma has been recognized in several experiments [18][19][20][21].…”

Section: Discussionmentioning

confidence: 99%

Global plasma simulation of charge state distribution inside a 2.45 GHz ECR plasma with experimental verification

Bodendorfer

Würz²,

Hohl

2010

Plasma Sources Sci. Technol.

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For the first time, the charge state distribution inside the MEsskammer für FlugzeitInStrumente und Time-Of-Flight (MEFISTO) electron cyclotron resonance (ECR) plasma and in the extracted ion beam was successfully simulated. A self-consistent ECR plasma ionization model (Hohl M 2002 MEFISTO II: Design, setup, characterization and operation of an improved calibration facility for solar plasma instrumentation PhD Thesis University of Bern) was further developed, recomputing the ion confinement time for every ion species and in every time step based on the actual plasma potential rather than using a prescribed constant ion confinement time. The simulation starts with a user defined set of initial conditions and develops the problem in time space by an adaptive step length fourth order Runge-Kutta (RK4) solver, considering particle densities based on ionization rates, recombination rates, ion confinement times and plasma potential. At the simulation end, a steady-state ion charge state distribution is reached, which is in excellent agreement with the measured ion beam charge state distribution of the MEFISTO ion source for Ar 1+ to Ar 5+ and in good agreement for Ar 6+ .

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Section: Discussionmentioning

confidence: 99%

Global plasma simulation of charge state distribution inside a 2.45 GHz ECR plasma with experimental verification

Bodendorfer

Würz²,

Hohl

2010

Plasma Sources Sci. Technol.

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Characteristics of highly charged ions produced at Kobe EBIS under modulated operation

et al. 2019

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The electron beam ion source (Kobe EBIS) has been developed to perform modification of surfaces using highly charged ions (HCIs) at the Kobe University, Japan. Recent study revealed that periodic intermission of electron beam improves charge state distribution of extracted ions. The period of intermission is in the order of 100 ms, and the width of beam‐off time is 1 ms or less. This operational mode (pulse mode) makes it possible to produce Ar15+ to Ar17+ effectively, whereas the charge is limited less than 14+ under the ordinary operational mode with direct current (DC) electron beam. A spike of HCIs with a peak current in the order of nA is also observed at each moment of electron beam off. The measurement of the time evolution of Ar16+ intensity around the timing of mode change revealed that the intensity of extracted Ar16+ changes slowly after mode change with a time constant of few seconds.

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