2008 IEEE International Electron Devices Meeting 2008
DOI: 10.1109/iedm.2008.4796620
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Stack friendly all-oxide 3D RRAM using GaInZnO peripheral TFT realized over glass substrates

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Cited by 29 publications
(16 citation statements)
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“…For example, the most straightforward application of resistance switching devices is in crossbar digital memories [8,10,13,16,21]. For such structures, the temperature increase is caused by Joule heating.…”
Section: Introductionmentioning
confidence: 99%
“…For example, the most straightforward application of resistance switching devices is in crossbar digital memories [8,10,13,16,21]. For such structures, the temperature increase is caused by Joule heating.…”
Section: Introductionmentioning
confidence: 99%
“…These milestones, in turn, revived interest in the development of memristor-based ANNs and led to numerous few-or single-memristor demonstrations of synaptic functionality and simple associative memory [21][22][23][24][25][26][27][28] , as well as the theoretical modelling of large-scale networks 10,[29][30][31][32][33] . Despite significant progress in memristor crossbar memories 20,[34][35][36][37] , memristor-based ANNs have proven to be significantly more challenging and have yet to be demonstrated. This paper reports the first successful experimental demonstration of pattern classification by a single-layer perceptron network implemented with a memristive crossbar circuit, in which synaptic weights are realized as conductances of titanium dioxide memristors with nanoscale-active regions.…”
mentioning
confidence: 99%
“…The rectifying oxide heterojunctions can be utilized as select devices, especially for oxide-based RRAM memory elements [25][26][27][28]. A p-NiO x /n-TiO x diode has demonstrated a rectification ratio of 10 5 at ±3 V, ON current density of 5 × 10 3 A/cm 2 (at ∼2.5 V), and ideality factor of 4.3 [25].…”
Section: Oxide Heterojunction Diodesmentioning
confidence: 99%
“…A p-CuO x /n-InZnO x diode achieved higher ON current density of 10 4 A/cm 2 (at ∼1.3 V). It was integrated with NiO x RRAM in a two-layer 8 × 8 crossbar array [26,27] and with Al 2 O 3 antifuse in a one-time programmable (OTP) memory [28]. Oxide p-n heterojunction was also demonstrated in pZnORh 2 O 3 /n-InGaZnO 4 and achieved on/off ratio of 10 3 (at ±5 V), ideality factor of ∼2.3, and threshold voltage of 2.1 V [29].…”
Section: Oxide Heterojunction Diodesmentioning
confidence: 99%