1999
DOI: 10.1016/s0168-583x(98)00538-2
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Stability of cavities formed by He+ implantation in silicon

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Cited by 24 publications
(12 citation statements)
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“…6 MeV, 2ϫ10 16 cm Ϫ2 ͒. After implantation the samples were subjected to thermal annealing at 800°C for 30 min.…”
Section: Influence Of Dose Rate On Bubble Formation By High Energy Hementioning
confidence: 99%
“…6 MeV, 2ϫ10 16 cm Ϫ2 ͒. After implantation the samples were subjected to thermal annealing at 800°C for 30 min.…”
Section: Influence Of Dose Rate On Bubble Formation By High Energy Hementioning
confidence: 99%
“…In the very first publications on this subject, Griffioen et al [3,4] reported that the as-implanted microstructure consists in a very high density of helium bubbles in the range 2-3 nm. As other groups [23], our measurements did not allow us to quantify both the density and the size of the nanocavities in the keV as-implanted sample with such a precision.…”
Section: Small-angle X-ray Scattering Experimentsmentioning
confidence: 71%
“…The latter mechanism must be applied to a conservative system and thus should be greatly limited by the loss of V at the sample surface. According to nuclear reaction analysis (NRA), the desorption rate decreases significantly in the early stage of annealing [15,16]. These results suggest that He atoms remain in the sample even after high temperature annealing.…”
Section: Introductionmentioning
confidence: 99%
“…These results suggest that He atoms remain in the sample even after high temperature annealing. The parameters which can control the cavity growth are numerous: the local concentrations of V and self-interstitial at Rp, the distance between the cavities and the surface and the impurity concentration in the Si matrix [15,[7][8][9][10][11][12][13][14][15][16][17][18][19][20]. So far, the nucleation and growth mechanisms of cavities are still unclear and under debate.…”
Section: Introductionmentioning
confidence: 99%
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