Spark source mass spectrometry of silicon for solar cells

Hurrle, A.; Dietl, J.

doi:10.1007/bf00488601

Search citation statements

Order By: Relevance

Paper Sections

Select...

Impurities Analysis and General Characterization1

Citation Types

Supporting

Mentioning

Contrasting

Year Published

1981

2012

Publication Types

Select...

Book2

Article2

Other1

Relationship

Self Cite0

Independent5

Authors

Journals

Cited by 5 publications

(1 citation statement)

References 1 publication

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Spark-source mass spectrograph is the only analytical instrument capable of supplying information on practically all elements simultaneously with a sensitivity of 10-8. It has been shown that measurements by SSMS can generally be relied upon with a factor of two, provided careful calibration is performed 59 ).…”

Section: Impurities Analysis and General Characterizationmentioning

confidence: 99%