2003
DOI: 10.1007/bf02704325
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Space charge limited conduction in CdSe thin films

Abstract: The current (I)-voltage (V) characteristics of thermally evaporated CdSe thin films having thickness in the range 850-3000 Å and deposited within the substrate temperature of 303-573 K show nearly linear dependence at low voltage and afterwards a non-linear behaviour at higher voltage range. A detailed study of I-V curves in dark and under illumination clearly reveals the mechanism as ohmic at low voltage and that of trap limited space charge limited conduction (SCLC) at higher voltage. The transition voltage … Show more

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Cited by 48 publications
(12 citation statements)
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“…where ε is the dielectric constant of CdSe sample whose value is taken to be 5⋅76 (Kalita et al 2003). Using (7) in (6) the relation for capture cross section is given by…”
Section: Mobility Activation In Cdse Thin Filmsmentioning
confidence: 99%
“…where ε is the dielectric constant of CdSe sample whose value is taken to be 5⋅76 (Kalita et al 2003). Using (7) in (6) the relation for capture cross section is given by…”
Section: Mobility Activation In Cdse Thin Filmsmentioning
confidence: 99%
“…The value of voltage exponent, in second section, shows that the traps in the bandgap of Sb 2 O 3 have exponential energy distribution [23,24]. In the ohmic region simply Ohm's law for n-type semiconductor may describe it [10]:…”
Section: Field E>10mentioning
confidence: 99%
“…The group of chalcogenide glass A II B VI compounds has been found to be of much interest owing to their wide range of chemical, structural, electrical and optical properties [1,2]. Intensive investigations have been carried out to prepare such compounds in single crystal and thin film form [3,4].…”
Section: Introductionmentioning
confidence: 99%