2019
DOI: 10.1021/acsaelm.9b00280
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Solution-Processed-2D on 3D Heterojunction UV–Visible Photodetector for Low-Light Applications

Abstract: We have demonstrated a heterojunction photodetector (PD) based on reduced graphene oxide (r-GO) and metal−organic chemical vapor deposition (MOCVD)-grown gallium nitride (GaN) that can sense very low light intensities in the above-band-gap and below-band-gap regimes, showing no and high photoconductive gains, respectively. The current− voltage characteristics of the device transforms from quasi photoconductive to photodiode behavior once the illumination wavelength is in the below-band-gap regime. The device e… Show more

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Cited by 17 publications
(15 citation statements)
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“…Furthermore, to understand the excellent optoelectrical performances of photodetectors, the relationship between the photocurrent and power densities were well described using the power law, i.e., I ph α NP θ , which can be retrieved from the fitting plot, as shown in Figure a, where I ph is the photocurrent value, N is the proportionality constant, P stands for light intensity, and θ is the empirical coefficient. The estimated nonunity exponent (θ) value from the fitting points was found to be 0.86 for M4.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Furthermore, to understand the excellent optoelectrical performances of photodetectors, the relationship between the photocurrent and power densities were well described using the power law, i.e., I ph α NP θ , which can be retrieved from the fitting plot, as shown in Figure a, where I ph is the photocurrent value, N is the proportionality constant, P stands for light intensity, and θ is the empirical coefficient. The estimated nonunity exponent (θ) value from the fitting points was found to be 0.86 for M4.…”
Section: Resultsmentioning
confidence: 99%
“…To quantitatively investigate the gain mechanism and the optoelectronic efficiency conversion of PD, we have plotted a graph for responsivity ( R λ ) and external quantum efficiency (EQE), as shown in Figure b,c. The responsivity is related to the generated photocurrent per incident power density of light, where EQE is defined as the ratio of the number of excited electrons collected at electrodes to the incident photons, in which both are calculated using the following equations, respectively. ,, where Δ I are the differences in the photocurrent and the dark current (Δ I = I ph – I d ), P is the light power density, A is the effective illuminated area of the sample, h is Planks constant, c is the speed of light, e is the charge of an electron, and λ is the wavelength of the incident LED light. In accordance with both equations, one can observe that R λ and EQE were strongly dependent on light intensity.…”
Section: Resultsmentioning
confidence: 99%
“…[39][40][41][42] To date, there have been few research studies on GaN-based TMD hybrid heterostructure photodetectors that depict its capability for obtaining better response in UV region. [43][44][45][46][47][48][49][50][51][52][53] For instance, the responsivity of 24.6 A W −1 for MoS 2 on GaN photodetectors by introducing tensile strain on the heterostructure with the deposition of 3 nm Al 2 O 3 has been reported. [51] The wafer-scale growth of thin MoSe 2 films on GaN by using the chemical vapor deposition technique has been discussed.…”
Section: Introductionmentioning
confidence: 99%
“…[ 13 ] Therefore, an alternative strategy of stacking 2D materials with conventional 3D semiconductors has been adopted so that materials with high light absorption coefficients can be used based on phototransistor and photodiode device schemes. [ 14–18 ]…”
Section: Introductionmentioning
confidence: 99%
“…[13] Therefore, an alternative strategy of stacking 2D materials with conventional 3D semiconductors has been adopted so that materials with high light absorption coefficients can be used based on phototransistor and photodiode device schemes. [14][15][16][17][18] In vdW 2D/3D heterostructures, the region comprising the 3D semiconductor, which may include III-V compounds as well as group IV semiconductors can be controlled via a reliable and stable fabrication process. [19] Germanium (Ge) in group IV, which has a narrow bandgap of ≈0.7 eV, is promising not only for Infrared (IR) detection but also for complementary metal-oxide-semiconductor (CMOS)-compatible processes and designs.…”
mentioning
confidence: 99%