2006
DOI: 10.1016/j.sysarc.2005.05.004
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Software-based self-testing of microprocessors

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Cited by 19 publications
(9 citation statements)
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“…We plan to develop application based tests for programs with more complex control flow. In particular, we can use here various structural coverage metrics (compare [23]) to select representative input data. This can be also combined with structural and pseudorandom testing schemes [23].…”
Section: Testing Schemesmentioning
confidence: 99%
“…We plan to develop application based tests for programs with more complex control flow. In particular, we can use here various structural coverage metrics (compare [23]) to select representative input data. This can be also combined with structural and pseudorandom testing schemes [23].…”
Section: Testing Schemesmentioning
confidence: 99%
“…Similarly in the hardware domain, a few decades of research lead to the development of promising approaches. For example, Sosnowski [17] presents a concept to merge hardware and software efforts. He argues that in hardware-related design approaches, built-in-self-test (BIST) and design-for-testability (DFT) mechanisms are currently well practiced [17].…”
Section: Related Workmentioning
confidence: 99%
“…For example, Sosnowski [17] presents a concept to merge hardware and software efforts. He argues that in hardware-related design approaches, built-in-self-test (BIST) and design-for-testability (DFT) mechanisms are currently well practiced [17]. These are developed dynamically and frequently used in chips and microprocessors.…”
Section: Related Workmentioning
confidence: 99%
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“…On activation of any of these traps, a full system reset of the microcontroller should be forced. On system boot-up/reset, the microcontroller should perform -at minimum -the following software-based self-tests [24]:…”
Section: Runtime Behaviormentioning
confidence: 99%