1997
DOI: 10.1016/s0040-6090(96)08956-0
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SnO2 thin films prepared by the sol-gel process

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1997
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Cited by 70 publications
(21 citation statements)
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“…Although we only had three data points at each temperature, there appeared to have been a limiting carrier concentration that did not exceed the crystalline films at a lower oxygen content. The hall mobility in both films appeared to have been comparable and the higher values were 5 cm 2 /Vs to 7 cm 2 /Vs, which was similar to the reported value of sputtered SnO 2 films [10,11]. Since the mobility depended on several scattering mechanisms [8,14,24,25], crystalline films at 300°C could have had a large grain formation, as explained above, leading to a compatible mobility value with amorphous films.…”
Section: Resultssupporting
confidence: 83%
See 1 more Smart Citation
“…Although we only had three data points at each temperature, there appeared to have been a limiting carrier concentration that did not exceed the crystalline films at a lower oxygen content. The hall mobility in both films appeared to have been comparable and the higher values were 5 cm 2 /Vs to 7 cm 2 /Vs, which was similar to the reported value of sputtered SnO 2 films [10,11]. Since the mobility depended on several scattering mechanisms [8,14,24,25], crystalline films at 300°C could have had a large grain formation, as explained above, leading to a compatible mobility value with amorphous films.…”
Section: Resultssupporting
confidence: 83%
“…As these materials are often desired in a thin film form, a wide range of deposition techniques have been used to deposit SnO 2 thin films: sputtering, pulsed laser deposition, chemical vapor deposition (CVD), sol-gel techniques, and spray pyrolysis [6][7][8][9][10][11][12][13][14]. Sputtering techniques are the most commonly used when device quality films are required.…”
Section: Introductionmentioning
confidence: 99%
“…The calcium is thought to have been leached from the glass during the sputtering process, as has been observed previously in the case of sol-gel deposition of Sn02 onto glass. 15 Notably, the films grown by MOCVD do not contain this impurity. The fact that the levels of Ca and C contamination in the sputtered film are roughly similar may imply that they are present in the form of CaCO3 Such an assumption leads to an average stoichiometry for the tin oxide of Sn0202, changing to SnO,,5 near the surface of the film, as shown in Table III.…”
Section: Methodsmentioning
confidence: 99%
“…Bu nedenle spintronik uygulamalar için Co katkılı ZnO (Co:ZnO) ince filmlerin oldukça verimli çalışacağı öngörülmektedir. Özellikle Mn, Co ve Fe gibi geçiş elementlerinin (TM) belirli oranlarda ZnO yapısına girmesi; spin valfi, spintabanlı ışık yayan diyot ve spin-alan etkili transistör uygulamaları için oldukça elverişli olacağına dair araştırmalar vardır [19][20][21][22]. Bu tür malzemelerin ince filmleri, çeşitli film hazırlama tekniklerinin yanı sıra çözelti-temelli (kimyasal buhar çöktürme, ultrasonik kimyasal püskürtme, spin kaplama vb.)…”
Section: Introductionunclassified