Sn-Se-Te İnce Filmlerinin Üretimi ve Yapısal Karakterizasyonu

Abstract

In this study, the effects of Se and Te substitution on structural and morphological properties of SnSeTe (TSeTe) thin films are studied. TSeTe thin films are fabricated by using the thermal evaporation technique. In order to determine the structural and morphological properties of these films, XRD (X-ray diffraction), SEM (Scanning electron microscopy), EDXA (Energy dispersive X-Ray analysis), Raman Analysis, and AFM (Atomic Force Microscopy) measurements are carried out. Then, the effects of post-annealing on properties of thin films are investigated.