“…The former includes mechanically controllable break junctions (MCBJ) [ 7 , 8 ] and scanning tunneling microscopy (STM) break junctions [ 9 , 10 , 11 , 12 ] as well as electromigration [ 13 , 14 , 15 ] platforms. Conducting probe atomic force microscopy (CP-AFM) [ 16 , 17 , 18 , 19 , 20 ], cross-wires [ 21 , 22 , 23 , 24 , 25 ] and large area liquid metal (eutectic gallium indium alloy EGaIn) based molecular junctions [ 15 , 26 , 27 , 28 ] are examples of the second category. For the latter, the key role played by the number of molecules and the related effective contact area has been thoroughly emphasized in the literature [ 5 , 26 , 29 ].…”