1993
DOI: 10.1016/0379-6779(93)91175-2
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Small-angle X-ray-scattering investigation of poly(p-phenylene) with fractal properties

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Cited by 13 publications
(8 citation statements)
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“…Here we employ small angle X-ray scattering (SAXS) to investigate the properties of parent PANI, poly(omethoxyaniline) (POMA) and poly(o-ethoxyaniline) (POEA) in solution at various pHs and doping acids. SAXS is useful to probe the material structure on a scale from 0.05 to 2000 Å [28,29], as it may provide statistically meaningful measurements of total volumes, surface areas and scattering centers [30]. Knowledge about the external surface structure of the polymer can be obtained by measurements of the scattering intensity I (q) versus the scattering vector modulus.…”
Section: Introductionmentioning
confidence: 99%
“…Here we employ small angle X-ray scattering (SAXS) to investigate the properties of parent PANI, poly(omethoxyaniline) (POMA) and poly(o-ethoxyaniline) (POEA) in solution at various pHs and doping acids. SAXS is useful to probe the material structure on a scale from 0.05 to 2000 Å [28,29], as it may provide statistically meaningful measurements of total volumes, surface areas and scattering centers [30]. Knowledge about the external surface structure of the polymer can be obtained by measurements of the scattering intensity I (q) versus the scattering vector modulus.…”
Section: Introductionmentioning
confidence: 99%
“…Small-angle X-ray scattering (SAXS) is one of the most reliable techniques for surface analysis in the scale of 0.5-200 nm. 26 A simple comparison of SAXS patterns of the polyaniline films electrodeposited onto two different substrate electrodes ( Figure 5) reveals that the normalized SAXS intensity is smaller for the case of plastically deformed Pd substrate. This indicates a smoother surface in the scale under investigation, as the curve slope is smaller.…”
Section: Resultsmentioning
confidence: 99%
“…The porosity properties have been measured/ estimated using different methods, such as low-temperature N 2 sorption [3,10,11], cyclic voltammetry [12], film density analysis [1], standard porosimetry (in the case of polyaniline (PANI) and polyparaphenylene (PPP) [13,14], and small-angle X-ray scattering SAXS [15]. SAXS and its modifications have been found to be an advanced scattering technique for investigation of the properties of nanostructured polymeric materials [15][16][17][18][19][20][21][22]. Polymers like PPy [15,19,20], PANI [17,18], poly(p-phenylene) [16], polypropylene [21], poly(amide) and poly(imide) [22] and properties like the degree of crystallinity [19], porosity [15,21,22] and fractal dimension [16][17][18]20,21] have been widely examined.…”
Section: Introductionmentioning
confidence: 99%
“…SAXS and its modifications have been found to be an advanced scattering technique for investigation of the properties of nanostructured polymeric materials [15][16][17][18][19][20][21][22]. Polymers like PPy [15,19,20], PANI [17,18], poly(p-phenylene) [16], polypropylene [21], poly(amide) and poly(imide) [22] and properties like the degree of crystallinity [19], porosity [15,21,22] and fractal dimension [16][17][18]20,21] have been widely examined. Despite the achievements mentioned above, there is still very limited data regarding the dependencies between the thickness and porosity of ECP layers, especially of thin layers.…”
Section: Introductionmentioning
confidence: 99%