ISTFA 2001: Conference Proceedings From the 27th International Symposium for Testing and Failure Analysis 2001
DOI: 10.31399/asm.cp.istfa2001p0023
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Single Point PICA Probing with an Avalanche Photo-Diode

Abstract: For time resolved hot carrier emission from the backside, an alternate approach is demonstrated termed single point PICA. The single point approach records time resolved emission from an individual transistor using time-correlated-single-photon counting and an avalanche photo-diode. The avalanche photo-diode has a much higher quantum efficiency than micro-channel plate photo-multiplier tube based imaging cameras typically used in earlier approaches. The basic system is described and demonstrated from the backs… Show more

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