2003
DOI: 10.1109/tns.2003.821813
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Single particle dark current spikes induced in CCDs by high energy neutrons

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Cited by 35 publications
(17 citation statements)
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“…This illustrates the care needed to allow for post irradiation defect annealing when performing displacement damage testing. (See also the discussion in [5], which came to a similar conclusion.) What can be said with some certainty, is that the probability for RTS pixels does not scale with inelastic NIEL (otherwise the probability at 1.5 MeV would be very small).…”
Section: A Dark Current Profilesmentioning
confidence: 55%
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“…This illustrates the care needed to allow for post irradiation defect annealing when performing displacement damage testing. (See also the discussion in [5], which came to a similar conclusion.) What can be said with some certainty, is that the probability for RTS pixels does not scale with inelastic NIEL (otherwise the probability at 1.5 MeV would be very small).…”
Section: A Dark Current Profilesmentioning
confidence: 55%
“…[1 ], [2], [3 ], [4], [5] , [6], [7]). However, relatively few device types have been investigated and the nature of the lattice defects responsible for the effects remains unknown.…”
Section: Introductionmentioning
confidence: 99%
“…This is why the mechanisms by which energetic protons degrade the charge transfer efficiency (CTE = 1 -CTI) and produce hot pixels, have been studied thoroughly for many years (Hopkinson et al 1996;Gilard et al 2008, for example). The interaction with neutrons has received attention as well (Chugg et al 2003).…”
Section: Hot Pixelsmentioning
confidence: 99%
“…Different studies have characterized the statistical behavior of hot pixels, showing in particular that they demonstrate the phenomenology of random telegraph signals (RTS; Hopkins & Hopkinson 1993;Chugg et al 2003;Hopkinson et al 2007).…”
Section: Hot Pixelsmentioning
confidence: 99%
“…They are therefore useful tools to study displacement damage effects in CCDs, as opposed to proton irradiation, which is also responsible for total dose effects. 11 An analysis of DSNU and dark signal spike in a CCD irradiated by 90 MeV neutrons is presented in 12 and single particle displacement damage in CCDs induced by high energy neutrons is presented in. 13 Neutron radiation effects on CCDs used in the SLD vertex detector are presented in.…”
Section: Introductionmentioning
confidence: 99%