Single event upsets in implantable cardioverter defibrillators

Bradley, Peter D.; Normand, E.

doi:10.1109/23.736549

Cited by 76 publications

(35 citation statements)

References 34 publications

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“…For instance, fx32 [4]. [28] is the 32-bit fixedpoint representation with 4 bits allocated for the integer part.…”

Section: Resultsmentioning

confidence: 99%

“…[28] 0.021 0.021 0 0.022 0 0.021 0 fx32 [13]. [19] 0.021 0.021 0 0.024 2 0.021 1 fx16 [4]. [12] 0.021 0.022 0 0.023 0 0.022 0 fx16 [13].…”

Section: Algorithm 1 Kalman Filter Stepmentioning

confidence: 99%

“…[12] 0.021 0.021 0 0.032 0 0.026 0 fx16 [13]. [3] 0 [4]. [28] 0.021 0.021 0 0.022 0 0.021 0 fx32 [13].…”

Section: Algorithm 1 Kalman Filter Stepmentioning

confidence: 99%

“…As modern transistors shrink, the probability of a fault occurring increases. Soft errors have traditionally been a concern in safety-critical systems including medical devices [4] and aviation/space applications where chips operate under increased radiation [7], [23]. Today, cost pressure and energy constraints limit the applicability of massive redundancy, while increased complexity of calculations performed in novel applications such as robots on search-and-rescue missions necessitate the usage of powerful microprocessors.…”

mentioning

confidence: 99%

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An FPGA-based framework for run-time injection and analysis of soft errors in microprocessors

Sauer

Tomashevich

Müller

et al. 2011

2011 IEEE 17th International on-Line Testing Symposium

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Abstract-State-of-the-art cyber-physical systems are increasingly deployed in harsh environments with non-negligible soft error rates, such as aviation or search-and-rescue missions. State-of-the-art nanoscale manufacturing technologies are more vulnerable to soft errors. In this paper, we present an FPGAbased framework for injecting soft errors into user-specified memory elements of an entire microprocessor (MIPS32) running application software. While the framework is applicable to arbitrary software, we demonstrate its usage by characterizing soft errors effects on several software filters used in aviation for probabilistic sensor data fusion.

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“…For instance, fx32 [4]. [28] is the 32-bit fixedpoint representation with 4 bits allocated for the integer part.…”

Section: Resultsmentioning

confidence: 99%

“…[28] 0.021 0.021 0 0.022 0 0.021 0 fx32 [13]. [19] 0.021 0.021 0 0.024 2 0.021 1 fx16 [4]. [12] 0.021 0.022 0 0.023 0 0.022 0 fx16 [13].…”

Section: Algorithm 1 Kalman Filter Stepmentioning

confidence: 99%

“…[12] 0.021 0.021 0 0.032 0 0.026 0 fx16 [13]. [3] 0 [4]. [28] 0.021 0.021 0 0.022 0 0.021 0 fx32 [13].…”

Section: Algorithm 1 Kalman Filter Stepmentioning

confidence: 99%

mentioning

confidence: 99%

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An FPGA-based framework for run-time injection and analysis of soft errors in microprocessors

Sauer

Tomashevich

Müller

et al. 2011

2011 IEEE 17th International on-Line Testing Symposium

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show abstract

“…After this discovery, borophospho-silicate glass (BPSG) that contained natural boron and the isotope boron-10 was removed from the manufacturing processes. In 1996, a survey of computer log files showed that a supercomputer with 156 Gbit of DRAM could fail several times per day [11] and the incidence of soft errors in implanted pacemakers was about the same as if the errors were caused by background neutron radiation [12]. Currently, the main effort is focused on improving the accuracy of SER models and finding cost-effective methods of reducing failure rates.…”

Section: Introductionmentioning

confidence: 99%

Characterization of soft errors caused by single event upsets in CMOS processes

Karnik

Hazucha

2004

IEEE Trans.Dependable and Secure Comput.

442

211

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Abstract-Radiation-induced single event upsets (SEUs) pose a major challenge for the design of memories and logic circuits in highperformance microprocessors in technologies beyond 90nm. Historically, we have considered power-performance-area trade offs. There is a need to include the soft error rate (SER) as another design parameter. In this paper, we present radiation particle interactions with silicon, charge collection effects, soft errors, and their effect on VLSI circuits. We also discuss the impact of SEUs on system reliability. We describe an accelerated measurement of SERs using a high-intensity neutron beam, the characterization of SERs in sequential logic cells, and technology scaling trends. Finally, some directions for future research are given.

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Radiotherapy-Induced Malfunction in Contemporary Cardiovascular Implantable Electronic Devices

et al. 2015

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In a cohort of contemporary CIEDs, all cases of single-event upset malfunction occurred in the setting of notable neutron production, at a rate of 21% for neutron-producing RT and 0% for non-neutron-producing RT. Where clinically feasible, the use of non-neutron-producing RT is recommended. Given the lack of correlation between CIED malfunction and incident dose observed up to 5.4 Gy, invasive CIED relocation procedures in these settings can be minimized.

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Single event upsets in implantable cardioverter defibrillators

Cited by 76 publications

References 34 publications

An FPGA-based framework for run-time injection and analysis of soft errors in microprocessors

An FPGA-based framework for run-time injection and analysis of soft errors in microprocessors

Characterization of soft errors caused by single event upsets in CMOS processes

Radiotherapy-Induced Malfunction in Contemporary Cardiovascular Implantable Electronic Devices

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