2019
DOI: 10.3390/electronics8060618
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Single Event Transients in CMOS Ring Oscillators

Abstract: In this paper, a time-variant analysis is made on Single-Event Transients (SETs) in integrated CMOS ring oscillators. The Impulse Sensitive Function (ISF) of the oscillator is used to analyze the impact of the relative moment when a particle hits the circuit. The analysis is based on simulations and verified experimentally with a Two-Photon Absorption (TPA) laser setup. The experiments are done using a 65 nm CMOS test chip.

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Cited by 4 publications
(3 citation statements)
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References 22 publications
(27 reference statements)
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“…The high total doses applied in this range of experiments provide a complete evaluation of subthreshold circuits in the whole range of space applications, radiation physics instruments, and medical applications. The authors in [7] discussed a time-variant on Single-Event Transients (SETs) in integrated CMOS ring oscillators. The Impulse Sensitive Function (ISF) of the oscillator was used to analyze the impact of the relative moment when a particle hit the circuit.…”
Section: The Present Issuementioning
confidence: 99%
“…The high total doses applied in this range of experiments provide a complete evaluation of subthreshold circuits in the whole range of space applications, radiation physics instruments, and medical applications. The authors in [7] discussed a time-variant on Single-Event Transients (SETs) in integrated CMOS ring oscillators. The Impulse Sensitive Function (ISF) of the oscillator was used to analyze the impact of the relative moment when a particle hit the circuit.…”
Section: The Present Issuementioning
confidence: 99%
“…The two sets of values were expressed for different time constants versus critical charge Q and LET. The strike of an ionizing particle could be modeled by inserting a current pulse on each P-N junction, with the direction of the injected current depending on the device type [ 33 ], as shown in Figure 12 . Moreover, the effects generated by the injected currents were strongly sensitive to the circuit conditions, requiring the analysis of the system in different states.…”
Section: Simulations Resultsmentioning
confidence: 99%
“…To enable optimizing the radiation-hardness of this initial design by properly sizing the unit cell series resistor, the achievable reduction of SEE sensitivity is quantified using charge injection simulations. These parametric simulations cover multiple dimensions to adequately assess the circuit sensitivity: 1) As expected from the periodic, time-dependent nature of impulse sensitivity function of oscillators [13], SET responses of ring oscillator circuits were also shown to be time-dependent [16]. Therefore, charge injections need to be performed at multiple instants along the oscillation period to identify points of maximum sensitivity.…”
Section: Radiation Effects Simulationsmentioning
confidence: 99%