2002
DOI: 10.1016/s0167-9317(02)00555-5
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Simultaneous etching of polysilicon materials with different doping types by low-damage transformer-coupled plasma technique

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Cited by 6 publications
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“…A use of F atom should be minimized in deep trench silicon etching for ideal anisotropic etching because F and Cl can cause spontaneous etching (Hung et al, 2002). Fig.…”
Section: Resultsmentioning
confidence: 99%
“…A use of F atom should be minimized in deep trench silicon etching for ideal anisotropic etching because F and Cl can cause spontaneous etching (Hung et al, 2002). Fig.…”
Section: Resultsmentioning
confidence: 99%