Simulations of the plasma dynamics in high-current ion diodes

Pointon, T.D.; Mehlhorn, T. A.

doi:10.1016/s0168-9002(98)00422-7

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“…[20]). Researchers in pulsed power physics rely on magnetic insulation in a similar way to contain stray electrons in high-power waveguides [23].…”

Section: Discussionmentioning

confidence: 99%

Numerical simulation of the generation of secondary electrons in the High Current Experiment

Stoltz

Furman

Vay

et al. 2003

Phys. Rev. ST Accel. Beams

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Electron effects in the High Current Experiment (HCX) are studied via computer simulation. An approximate expression for the secondary electron yield for a potassium ion striking stainless steel is derived and compared with experimental results. This approximate expression has a peak of roughly 55 electrons at normal incidence at an ion energy of 60 MeV. Using an empirical angular dependence, the secondary electron yield is combined with a numerical simulation of the HCX ion beam dynamics to obtain an estimate for the number of secondary electrons expected per ion-wall collision in the HCX. This estimate is that approximately 150-200 electrons per ion collision may result in the HCX.

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“…[20]). Researchers in pulsed power physics rely on magnetic insulation in a similar way to contain stray electrons in high-power waveguides [23].…”

Section: Discussionmentioning

confidence: 99%