2018
DOI: 10.1016/j.spmi.2018.08.028
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Simulation study of ZnO nanowire FET arrays for photosensitivity enhancement of UV photodetectors

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Cited by 17 publications
(2 citation statements)
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“…As illustrated in figure 4, the simulated values of J light with the applied reverse bias voltage at center wavelength are well in accordance with the values obtained analytically. The measured value of J light is larger than previously reported studies in [8,28,41,46]. Under self-powered mode, the ratio J light /J dark is 2.37 × 10 5 , 3.95 × 10 9 , and 1.42 × 10 13 for Device I, II, and III, respectively.…”
Section: Resultscontrasting
confidence: 63%
“…As illustrated in figure 4, the simulated values of J light with the applied reverse bias voltage at center wavelength are well in accordance with the values obtained analytically. The measured value of J light is larger than previously reported studies in [8,28,41,46]. Under self-powered mode, the ratio J light /J dark is 2.37 × 10 5 , 3.95 × 10 9 , and 1.42 × 10 13 for Device I, II, and III, respectively.…”
Section: Resultscontrasting
confidence: 63%
“…On the other hand, back reflection has not been considered during the simulation. Zinc oxide (ZnO) comes under the category of wide band gap semiconductor material having energy gap of 3.37 eV [24]. ZnO material is highly useful for photo sensing and opto coupler applications due to their high optical transmittance and absorbance property in visible and IR regions.…”
Section: Device Structure and Simulation Setupmentioning
confidence: 99%