Simulation of the Adhesion of Particles to Surfaces

Cooper, Kevin R.; Gupta, Anand; Beaudoin, Stephen P.

doi:10.1006/jcis.2000.7276

Cited by 147 publications

(149 citation statements)

References 34 publications

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“…Hence, we refer to Section 7.2. Yet some theoretical results [351][352][353][354] are generally valid, also for usual AFM-tips on rough samples. The surface energy of polar materials has been the object of several theoretical and experimental works in the past few years.…”

Section: Determination Of Hamaker Constants Adhesion and Surface Enementioning

confidence: 99%

“…This model was applied to colloid probe measurements between polystyrene spheres and a silicon wafer at different pH values that caused different surface roughness [559] and measured adhesion forces agreed much better with this model than with DLVO theory of a sphere/plane geometry. On the basis of this model, Cooper et al [351,560] generated computer representations of surface topographies as obtained by AFM imaging by distributions of hemispherical asperities and simulated adhesion forces between these surfaces. In a recent publication [561] rough surfaces were also modeled by fractals and a fast Fourier transform algorithm.…”

Section: Influence Of Roughness On Adhesionmentioning

confidence: 99%

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Force measurements with the atomic force microscope: Technique, interpretation and applications

Butt

Cappella

Kappl

2005

Surface Science Reports

3,214

2,949

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Section: Determination Of Hamaker Constants Adhesion and Surface Enementioning

confidence: 99%

Section: Influence Of Roughness On Adhesionmentioning

confidence: 99%

Force measurements with the atomic force microscope: Technique, interpretation and applications

Butt

Cappella

Kappl

2005

Surface Science Reports

3,214

2,949

View full text Add to dashboard Cite

“…We built the tip and clusters from thin vertical cylinders ͑1 ϫ 1 nm cross section͒ and summed the van der Waals interaction between them. 44 The Pd clusters were modeled in their expected shape of a truncated octahedron with an angle of 54.73°between the ͑001͒ top facet and the ͑111͒ side facets, and with a ratio of 0.45 between the cluster height and cluster base length. 32,33 The height and lateral size information was taken from the experimental topography and constant height images.…”

Section: Calculationsmentioning

confidence: 99%

Imaging the real shape of nanoclusters in scanning force microscopy

Pakarinen

Barth

Foster

et al. 2008

Journal of Applied Physics

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A quantitative comparison between experiment and theory is given for the constant height mode imaging of metal nanoclusters in dynamic scanning force microscopy. We explain the fundamental mechanisms in the contrast formation with the help of the system Pd/MgO͑001͒. The comparison shows that the shape and size of nanoclusters are precisely imaged due to the sharpness of the tip's last nanometer. This quantitative comparison proves our previously proposed model for the contrast formation.

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“…As a cause of this variation surface roughness and surface heterogeneity have been suggested [31][32][33][34][35][36][37]. The decrease of adhesion with surface roughness can influence particle adhesion.…”

Section: Introductionmentioning

confidence: 99%

On the Adhesion between Fine Particles and Nanocontacts: An Atomic Force Microscope Study

et al. 2006

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To optimize the handling of fine powders in industrial applications, understanding the interaction forces between single powder particles is fundamental. The forces between colloidal particles dominate the behavior of a great variety of materials, including paints, paper, soil, and many industrial processes. With the invention of the atomic force microscope (AFM), the direct measurement of the interaction between single micron-sized particles became possible. The adhesional contact between a particle and a substrate is a parameter for analyzing pull-off force data generated by AFM. The aim of this study was to understand surface interactions between fine particles. I measured the adhesion forces between AFM tips or particles attached to AFM cantilevers and different solid samples. Smooth and homogeneous surfaces such as silicon wafer, mica, or highly oriented pyrolytic graphite (HOPG), and more rough and heterogeneous surfaces such as iron particles or patterns of TiO 2 nanoparticles on silicon wafer were used. First, I addressed to the wellknown issue that AFM adhesion experiment results show wide distributions of adhesion forces rather than a single value. My experimental results show that variations in adhesion forces comprise fast (i.e., from one force curves to the next) random fluctuations and slower fluctuations, which occur over tens or hundreds of consecutive measurements. Slow fluctuations are not likely to be the result of variations in external factors such as lateral position, temperature, humidity, and so forth because those were kept constant. Even if two solid bodies are brought into contact under precisely the same conditions (same place, load, direction, etc.) the result of such a measurement will often not be the same as for the previous contact. The measurement itself will induce structural changes in the contact region which can change the value for the next adhesion force measurement.In the second part I studied the influence of humidity on the adhesion of nanocontacts. Humidity was adjusted relatively fast to minimize tip wear during one experiment. For hydrophobic surfaces, no signification change of adhesion force with humidity was observed. Adhesion force-versus-humidity curves recorded with hydrophilic surfaces either showed a maximum or continuously increased. I demonstrate that the results can be interpreted with simple continuum theory of the meniscus force. The meniscus force is calculated based on a model that includes surface roughness and takes into account different AFM tip (or particle) shapes by a two-sphere-model.Experimental and theoretical results show that the precise contact geometry has a critical influence on the humidity dependence of the adhesion force.Changes of tip geometry on the sub-10-nm length scale can completely change adhesion force-versus-humidity curves. Our model can also explain the differences between earlier AFM studies, where different dependencies of the adhesion force on humidity were observed.Keywords: Atomic force microscopy (AFM), cantile...

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Simulation of the Adhesion of Particles to Surfaces

Cited by 147 publications

References 34 publications

Force measurements with the atomic force microscope: Technique, interpretation and applications

Force measurements with the atomic force microscope: Technique, interpretation and applications

Imaging the real shape of nanoclusters in scanning force microscopy

On the Adhesion between Fine Particles and Nanocontacts: An Atomic Force Microscope Study

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