Simulation method for automotive electronic equipment immunity testing

Yasunori, Oguri; Ichikawa, Kouji

doi:10.1109/emceurope.2012.6396710

Cited by 9 publications

(10 citation statements)

References 3 publications

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“…As it was proposed and confirmed by multiple authors [7,8,12], the test setup can be described as a complex multipleport system. The goal of modelling is to reproduce the setup behaviour in a simulation environment.…”

Section: Bulk Current Injection (Bci) Test Setupmentioning

confidence: 98%

“…The IC models (either transistor-level or behavioural) wrapped in package models have to be attached to the floating PCB nodes, and the circuit simulations of any kind can be performed. The test setup model can also be efficiently used for substitution methods mentioned in [7,8,12].…”

Section: Model Applicationmentioning

confidence: 99%

“…[4][5][6][7][8]. In this work a generalised approach to develop an accurate component-based model of a system-level immunity test setup is described on the example of the bulk current injection (BCI) method.…”

Section: Introductionmentioning

confidence: 99%

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A generalized accurate modelling method for automotive bulk current injection (BCI) test setups up to 1 GHz

Miropolsky

Sapadinsky

Frei

2013

2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)

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Development of accurate system models of immunity test setups might be extremely time consuming or even impossible. Here a new generalized approach to develop accurate component-based models of different system-level EMC test setups is proposed on the example of a BCI test setup. An equivalent circuit modelling of the components in LF range is combined with measurement-based macromodelling in HF range. The developed models show high accuracy up to 1 GHz. The issues of floating PCB configurations and incorporation of low frequency behaviour could be solved. Both frequency and timedomain simulations are possible. Arbitrary system configurations can be assembled quickly using the proposed component models. Any kind of system simulation like parametric variation and worst-case analysis can be performed with high accuracy.

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Section: Bulk Current Injection (Bci) Test Setupmentioning

confidence: 98%

Section: Model Applicationmentioning

confidence: 99%

See 1 more Smart Citation

A generalized accurate modelling method for automotive bulk current injection (BCI) test setups up to 1 GHz

Miropolsky

Sapadinsky

Frei

2013

2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)

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show abstract

“…The simulation-based EMC analysis of ICs and EUTs and the virtualization of system-and IC-level EMC tests [1,2] are actively investigated by multiple research groups [4][5][6][7][8][9]. The possible approaches to define correlation of system-level and IC-level EMC tests are proposed.…”

Section: Introductionmentioning

confidence: 99%

“…The methods have different names, but are mostly based on the characterization of EUT / DUT RF immunity with DPI at IC-level and simulation of equivalent RF disturbance in terms of RF voltage, current or power, delivered to EUT / DUT in a system-level test. The test result prediction is then performed by comparing the simulated RF disturbance level in a system-level test setup to a known IC failure threshold [4][5][6][7][8][9].…”

Section: Introductionmentioning

confidence: 99%

Experimental validation of the generalized accurate modelling method for system-level bulk current injection setups up to 1 GHz

Miropolsky

Jahn

Klotz

et al. 2015

2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)

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A small-signal model of an automotive system-level bulk current injection (BCI) setup developed with a generalized accurate method shown in the previous publication [3] is verified on a case study with a demonstrator EUT module. The work utilizes an equivalent circuit modelling approach for the floating ungrounded EUT board and a macromodel for an active DUT IC. The simulation-based prediction of the BCI test results using an IC failure threshold and a small-signal simulation of RF levels at floating EUT module under BCI tests is shown. Due to high accuracy and detail of the BCI setup model, the prediction also shows very good correlation to real measurement data, both qualitatively and quantitatively, up to 1 GHz.

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Immunity simulation method for automotive power module using electromagnetic analysis

Kondo

Tsunada

Oka

et al. 2013

2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)

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Simulation method for automotive electronic equipment immunity testing

Cited by 9 publications

References 3 publications

A generalized accurate modelling method for automotive bulk current injection (BCI) test setups up to 1 GHz

A generalized accurate modelling method for automotive bulk current injection (BCI) test setups up to 1 GHz

Experimental validation of the generalized accurate modelling method for system-level bulk current injection setups up to 1 GHz

Immunity simulation method for automotive power module using electromagnetic analysis

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