Immunity simulation method for automotive power module using electromagnetic analysis

Kondo, Yumi; Tsunada, Kei; Oka, Naoki; Izumichi, Masato

doi:10.1109/emccompo.2013.6735208

Cited by 4 publications

(3 citation statements)

References 2 publications

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“…The simulation-based EMC analysis of ICs and EUTs and the virtualization of system-and IC-level EMC tests [1,2] are actively investigated by multiple research groups [4][5][6][7][8][9]. The possible approaches to define correlation of system-level and IC-level EMC tests are proposed.…”

Section: Introductionmentioning

confidence: 99%

“…[4][5][6][7][8][9][10][11][12][13], including equivalent circuit modelling e.g. [11,12], 3D MoM or FEM simulations [13] and even measurement-based S-parameter-macromodeling [8,9], possibly indirectly involving VectFit methods [14][15][16].…”

Section: Introductionmentioning

confidence: 99%

“…The methods have different names, but are mostly based on the characterization of EUT / DUT RF immunity with DPI at IC-level and simulation of equivalent RF disturbance in terms of RF voltage, current or power, delivered to EUT / DUT in a system-level test. The test result prediction is then performed by comparing the simulated RF disturbance level in a system-level test setup to a known IC failure threshold [4][5][6][7][8][9].…”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Experimental validation of the generalized accurate modelling method for system-level bulk current injection setups up to 1 GHz

Miropolsky

Jahn

Klotz

et al. 2015

2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)

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A small-signal model of an automotive system-level bulk current injection (BCI) setup developed with a generalized accurate method shown in the previous publication [3] is verified on a case study with a demonstrator EUT module. The work utilizes an equivalent circuit modelling approach for the floating ungrounded EUT board and a macromodel for an active DUT IC. The simulation-based prediction of the BCI test results using an IC failure threshold and a small-signal simulation of RF levels at floating EUT module under BCI tests is shown. Due to high accuracy and detail of the BCI setup model, the prediction also shows very good correlation to real measurement data, both qualitatively and quantitatively, up to 1 GHz.

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Section: Introductionmentioning

confidence: 99%