Development of accurate system models of immunity test setups might be extremely time consuming or even impossible. Here a new generalized approach to develop accurate component-based models of different system-level EMC test setups is proposed on the example of a BCI test setup. An equivalent circuit modelling of the components in LF range is combined with measurement-based macromodelling in HF range. The developed models show high accuracy up to 1 GHz. The issues of floating PCB configurations and incorporation of low frequency behaviour could be solved. Both frequency and timedomain simulations are possible. Arbitrary system configurations can be assembled quickly using the proposed component models. Any kind of system simulation like parametric variation and worst-case analysis can be performed with high accuracy.
A small-signal model of an automotive system-level bulk current injection (BCI) setup developed with a generalized accurate method shown in the previous publication [3] is verified on a case study with a demonstrator EUT module. The work utilizes an equivalent circuit modelling approach for the floating ungrounded EUT board and a macromodel for an active DUT IC. The simulation-based prediction of the BCI test results using an IC failure threshold and a small-signal simulation of RF levels at floating EUT module under BCI tests is shown. Due to high accuracy and detail of the BCI setup model, the prediction also shows very good correlation to real measurement data, both qualitatively and quantitatively, up to 1 GHz.
Abstract. Many investigations have been published on the transferability of RF immunity test results between system and IC-levels. The RF signal level at DUT (Device under Test) inputs, i.e. either RF voltage amplitude or RF input current, is used as a reference value for the load on the DUT. Existing approaches analyze the DUT response as a function of the RF signal level at a single input pin, e.g. supply voltage. Sufficient accuracy of such an approach could be shown in several cases, but results are not sufficient as a general solution for complex DUT. This paper proposes both theoretical analysis and practical implementation of a DPI setup, where a disturbance, equivalent to system-level BCI setup, can be delivered to multiple DUT input ports.
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