Simulation framework for coherent and incoherent X-ray imaging and its application in Talbot-Lau dark-field imaging

Ritter, André; Bartl, Peter; Bayer, Florian; Gödel, Karl C.; Haas, Wilhelm; Michel, Thilo; Pelzer, Georg; Rieger, Jens; Weber, Thomas; Zang, Andrea; Anton, G.

doi:10.1364/oe.22.023276

Cited by 27 publications

(28 citation statements)

References 10 publications

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“…The wave-field simulations were performed using the cxi framework. 19 The simulated visibility as a function of the photon energy is shown in blue in Fig. 1 for the setup parameters given in Table I.…”

Section: Methodsmentioning

confidence: 99%

A beam hardening and dispersion correction for x‐ray dark‐field radiography

et al. 2016

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The authors show that the influence of and dispersion can be quantified by simulation and, thus, measured image data can be corrected. The simulation allows to determine the corresponding dark-field artifacts for a wide range of setup parameters, like tube-voltage and filtration. The application of the proposed method to mammographic dark-field data shows an increase in contrast compared to the original image, which might simplify a further image-based diagnosis.

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Section: Methodsmentioning

confidence: 99%

A beam hardening and dispersion correction for x‐ray dark‐field radiography

et al. 2016

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“…In addition to research towards biological dark-field imaging, several groups developed analytical theoretical frameworks for the quantification of dark-field, working through either wave optics propagation 5 18 or analysis equivalent to spin-echo small-angle neutron scattering 19 . Although simulations are outside the scope of the work presented in this article, in recent years several groups have presented results from simulation frameworks towards the interpretation and quantification of dark-field signal 20 21 22 23 . Among these, Ritter et al .…”

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confidence: 99%

A generalized quantitative interpretation of dark-field contrast for highly concentrated microsphere suspensions

Gkoumas

Villanueva-Pérez

Wang

et al. 2016

Sci Rep

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In X-ray grating interferometry, dark-field contrast arises due to partial extinction of the detected interference fringes. This is also called visibility reduction and is attributed to small-angle scattering from unresolved structures in the imaged object. In recent years, analytical quantitative frameworks of dark-field contrast have been developed for highly diluted monodisperse microsphere suspensions with maximum 6% volume fraction. These frameworks assume that scattering particles are separated by large enough distances, which make any interparticle scattering interference negligible. In this paper, we start from the small-angle scattering intensity equation and, by linking Fourier and real-space, we introduce the structure factor and thus extend the analytical and experimental quantitative interpretation of dark-field contrast, for a range of suspensions with volume fractions reaching 40%. The structure factor accounts for interparticle scattering interference. Without introducing any additional fitting parameters, we successfully predict the experimental values measured at the TOMCAT beamline, Swiss Light Source. Finally, we apply this theoretical framework to an experiment probing a range of system correlation lengths by acquiring dark-field images at different energies. This proposed method has the potential to be applied in single-shot-mode using a polychromatic X-ray tube setup and a single-photon-counting energy-resolving detector.

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“…One can then select shorter R 1 and R 2 distances to reduce the system size. In the literature researchers employed laborious computer simulations to compute and compare the visibility values attainable with different system geometries [26,27,37]. In contrast to resorting to computer simulations, we show here that the closed-form formulas of Eqs.…”

Section: Resultsmentioning

confidence: 88%

Predicting visibility of interference fringes in X-ray grating interferometry

Yan¹,

Wu²,

Liu³

2016

Opt. Express

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The interference fringe visibility is a common figure of merit in designs of x-ray grating-based interferometers. Presently one has to resort to laborious computer simulations to predict fringe visibility values of interferometers with polychromatic x-ray sources. Expanding the authors' previous work on Fourier expansion of the intensity fringe pattern, in this work the authors developed a general quantitative theory to predict the intensity fringe pattern in closed-form formulas, which incorporates the effects of partial spatial coherence, spectral average and detector pixel re-binning. These formulas can be used to predict the fringe visibility of a Talbot-Lau interferometer with any geometry configuration and any source spectrum.

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Simulation framework for coherent and incoherent X-ray imaging and its application in Talbot-Lau dark-field imaging

Cited by 27 publications

References 10 publications

A beam hardening and dispersion correction for x‐ray dark‐field radiography

A beam hardening and dispersion correction for x‐ray dark‐field radiography

A generalized quantitative interpretation of dark-field contrast for highly concentrated microsphere suspensions

Predicting visibility of interference fringes in X-ray grating interferometry

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