1997
DOI: 10.1016/s0168-1176(97)00002-5
|View full text |Cite
|
Sign up to set email alerts
|

SIMS analysis of the near-surface layer of fibres of small diameter

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2

Citation Types

0
5
0

Year Published

1998
1998
1999
1999

Publication Types

Select...
3

Relationship

1
2

Authors

Journals

citations
Cited by 3 publications
(5 citation statements)
references
References 2 publications
0
5
0
Order By: Relevance
“…The primary ion beams for the following applications include Cs + , 99 Ga + , 100,101 Ar + , 102 or ReO 4 -, 100 and the mass spectrometers include quadrupoles, TOF, 100,101 or an ion trap. 100 Goshnick et al used SIMS for depth profiling of laboratory generated salt samples that included chlorides, nitrates, sulfates, and carbonates, representing environmental materials.…”
Section: B Secondary Ion Mass Spectrometry (Sims)mentioning
confidence: 99%
See 3 more Smart Citations
“…The primary ion beams for the following applications include Cs + , 99 Ga + , 100,101 Ar + , 102 or ReO 4 -, 100 and the mass spectrometers include quadrupoles, TOF, 100,101 or an ion trap. 100 Goshnick et al used SIMS for depth profiling of laboratory generated salt samples that included chlorides, nitrates, sulfates, and carbonates, representing environmental materials.…”
Section: B Secondary Ion Mass Spectrometry (Sims)mentioning
confidence: 99%
“…105 Another surface fiber study, performed by Lancin et al, was accomplished illustrating the capability to apply depth profiling to the outermost layers of fibers. 99 Finally, Nihei et al introduced the gallium focused ion beam, Ga-FIB, which allows for better spatial resolution. 98 It has a beam diameter of less than 0.1 µm that is not only superior to other ion beams but also allows analysis of submicron particles.…”
Section: B Secondary Ion Mass Spectrometry (Sims)mentioning
confidence: 99%
See 2 more Smart Citations
“…The primary beam consisted of Cs + ions extracted under a voltage of 10 kV. The procedure adopted during the analyses has been described by Lancin et al (1997).…”
mentioning
confidence: 99%