2005
DOI: 10.1016/j.solmat.2004.06.018
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Simplified edge isolation of buried contact solar cells

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Cited by 10 publications
(13 citation statements)
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“…The edge isolation was carried out after screep printing of acid barrier paste as a mask, by the reactive ion etching [14][15]. However, it can also be performed by wet etching [16][17] with HF, HNO 3 and CH 3 COOH acidic solution in the 1:3:1 volume ratio.…”
Section: Edge Isolation By Wet Chemical Etchingmentioning
confidence: 99%
“…The edge isolation was carried out after screep printing of acid barrier paste as a mask, by the reactive ion etching [14][15]. However, it can also be performed by wet etching [16][17] with HF, HNO 3 and CH 3 COOH acidic solution in the 1:3:1 volume ratio.…”
Section: Edge Isolation By Wet Chemical Etchingmentioning
confidence: 99%
“…The PEI is a dry‐etch and low‐temperature process, carried out at 70–150 °C in a batch process by coin stacking and pressing up to 500 wafers [ 10 ] in a screw clamp. In this way, only the edges of the wafers are exposed to the highly reactive fluoride and oxide radicals, generated by a plasma source [ 11 ] from tetrafluoromethane (CF 4 ) or sulfur hexafluoride (SF 6 ), as well as oxygen, [ 12 ] as shown in Figure . In a process duration of 120–240 s, about 2–5 μm silicon is etched off the wafer edges.…”
Section: A Review Of Edge Isolation Processesmentioning
confidence: 99%
“…In a process duration of 120–240 s, about 2–5 μm silicon is etched off the wafer edges. [ 11 ] The PEI is usually performed directly after emitter diffusion, which allows passivation of the edges in subsequent surface passivation. [ 11 ] The resulting mechanical stress due to the stacking and clamping of wafers leads to an increased risk of wafer breakage, especially for decreasing wafer thicknesses.…”
Section: A Review Of Edge Isolation Processesmentioning
confidence: 99%
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“…Recently, reactive ion etching (RIE) [5][6][7][8][9][10], as a kind of dry plasma etching processes that has been successfully performed in edge isolation [11], receives lots of attention on account of its low cost and no contamination of chemical waste. In this paper, the focus is on a dry texturing process using mixed plasma gases of SF 6 /O 2 without the use of Cl 2 and metal-assisted process.…”
Section: Introductionmentioning
confidence: 99%