“…In contrast, dry etching process based on SF 6 , XeF 2 , and other gases can be precisely controlled by adjusting the gas flow rate, etching power, chamber pressure, and so on. Different dry etching approaches have been reported to achieve Si tips for various applications, for example, an isotropic dry etching process for tips with small height (3.6 μm) and large apex (25–40 nm) [ 32 , 33 , 34 , 35 ], a multi-step etching approach for “rocket tips” with height greater than 10 μm [ 36 , 37 , 38 ], the design of ultra-small masks for tips with aspect ratios larger than 5 but small height (less than 3 μm) [ 39 , 40 ]. However, all these approaches have difficulties in batch fabrication of high-end tips due to the complicated process, the strict mask preparation, and low yield.…”