1982
DOI: 10.1016/b978-0-12-234105-2.50007-0
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Silicon Material Properties for VLSI Circuitry

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Cited by 12 publications
(41 citation statements)
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“…1,121,214 This phenomenon, noted earlier, was described as the Point-Defect Dilemma by Erhard Sirtl.…”
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confidence: 90%
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“…1,121,214 This phenomenon, noted earlier, was described as the Point-Defect Dilemma by Erhard Sirtl.…”
mentioning
confidence: 90%
“…1,121,122 The role of dislocations in silicon was eventually recognized to be an extremely complex topic and interrelated with point defects and impurities.…”
Section: Journal Of the Electrochemical Society 149 ͑5͒ S35-s58 ͑200mentioning
confidence: 99%
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