2019
DOI: 10.1109/ted.2019.2928484
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Silicon Carbide Bipolar Analog Circuits for Extreme Temperature Signal Conditioning

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Cited by 9 publications
(1 citation statement)
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“…Hence, all these methods assume that dependent single-signal operations and sequential procedures can make all diagnostic decisions. However, modern devices contain highly complicated logistic relationships [ 18 ] between test procedures and potential failure modes under many scenarios. Consequently, the testability design consumes too much human power and affects the testability design efficiency to prepare prior knowledge, especially under short production cycles.…”
Section: Introductionmentioning
confidence: 99%
“…Hence, all these methods assume that dependent single-signal operations and sequential procedures can make all diagnostic decisions. However, modern devices contain highly complicated logistic relationships [ 18 ] between test procedures and potential failure modes under many scenarios. Consequently, the testability design consumes too much human power and affects the testability design efficiency to prepare prior knowledge, especially under short production cycles.…”
Section: Introductionmentioning
confidence: 99%