2001 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium (IEEE Cat. No.01CH37173)
DOI: 10.1109/rfic.2001.935636
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SiGe-power amplifiers in flipchip and packaged technology

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Cited by 11 publications
(3 citation statements)
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“…Dual-band impedance transformation networks have been investigated mainly for low-noise amplifiers (LNA) [2]. For PAs, the published approaches use either separated signal paths [3, 4] or are based on discrete passives [5]. Dual-band impedance transformation networks are seldom applied for fully integrated PAs since they usually require more bulky inductors [6] which increases chip size and which makes them usually less efficient than an impedance transformation network for a single frequency.…”
Section: Introductionmentioning
confidence: 99%
“…Dual-band impedance transformation networks have been investigated mainly for low-noise amplifiers (LNA) [2]. For PAs, the published approaches use either separated signal paths [3, 4] or are based on discrete passives [5]. Dual-band impedance transformation networks are seldom applied for fully integrated PAs since they usually require more bulky inductors [6] which increases chip size and which makes them usually less efficient than an impedance transformation network for a single frequency.…”
Section: Introductionmentioning
confidence: 99%
“…Due to the significant self and mutual inductance of the wires and the real estate of the final die, this method is not suitable for a 5.8 GHz application. As summarized in Table I, another approach to reduce the lead inductance is a flip-chip approach [2]. However, it leads to a more complex thermal management scheme as well as increased PA package cost.…”
Section: Introductionmentioning
confidence: 99%
“…The emittergrounding inductance is crucial for the single-ended RF PA. Since the Si-based technology has no low-parasitic via-hole process, special treatments such as flip-chip [5] or heavily-doped sinker [6] are used in the literatures. In this paper, double-bond-wires (at a single pad) are used to minimize the emitter inductive-degeneration effect.…”
Section: Measurement Resultsmentioning
confidence: 99%