2009 35th Annual Conference of IEEE Industrial Electronics 2009
DOI: 10.1109/iecon.2009.5415122
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SiC power semiconductors in HEVs: Influence of junction temperature on power density, chip utilization and efficiency

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Cited by 80 publications
(30 citation statements)
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“…However, there are other factors at play here. These concerns have been echoed in a 2009 publication by Wrzecionko [18]. They demonstrated that although the theoretical limit for the operation of SiC power devices can be as high as 700 • C, in reality the optimum temperature was less than 300 • C. The authors were of the opinion that if a device is operated below the optimum temperature, it was not possible to take complete advantage of the junction gate field-effect transistor (JFET).…”
Section: Requirements Of Silicon Carbide Packagingmentioning
confidence: 94%
“…However, there are other factors at play here. These concerns have been echoed in a 2009 publication by Wrzecionko [18]. They demonstrated that although the theoretical limit for the operation of SiC power devices can be as high as 700 • C, in reality the optimum temperature was less than 300 • C. The authors were of the opinion that if a device is operated below the optimum temperature, it was not possible to take complete advantage of the junction gate field-effect transistor (JFET).…”
Section: Requirements Of Silicon Carbide Packagingmentioning
confidence: 94%
“…This means that the converter can be operated at a higher junction temperature [2,3] and has a better heat dissipation, which eventually leads to less need for thermal management and cooling, also resulting in more compact converters. Motor drive inverters will also benefit from the fast switching feature of SiC devices provided a small dv/dt or sine wave filter is used between the inverter and the motor.…”
Section: Introductionmentioning
confidence: 99%
“…The disadvantage of silicon carbide devices is the relatively large value of forward voltage (for example 2.4 V at forward currents 4 A (CSD04060) and 8 A (CSD08060) [5]). The operation of SiC devices in the wide range of ambient temperature have been studied by many authors [7][8][9], and it is believed that the ambient temperature limit for their operation may, in the future, exceed 600…”
Section: Introductionmentioning
confidence: 99%