IEEE 36th Conference on Power Electronics Specialists, 2005.
DOI: 10.1109/pesc.2005.1581866
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Shunt-Zero Based on CMOS Split-Drain: A Practical Approach for Current Sensing

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Cited by 5 publications
(5 citation statements)
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“…A comparison between the predicted conversion factors, FC, measured sensitivities, S, and their products with literature is presented in Table I. Results of this paper show significant improvement compared to the values reported previously [26], [27].…”
Section: Study Of Single and Spiral On-chip Concentratorsmentioning
confidence: 51%
“…A comparison between the predicted conversion factors, FC, measured sensitivities, S, and their products with literature is presented in Table I. Results of this paper show significant improvement compared to the values reported previously [26], [27].…”
Section: Study Of Single and Spiral On-chip Concentratorsmentioning
confidence: 51%
“…The sensitivities S RN and S RP are in general dependent on the electron and hole Hall carrier mobilities ( HN and HP , respectively) and not just the carrier mobilities ( N and P ). The Hall mobility, H is the product of the carrier mobility and the Hall factor r H [14] with electrons having higher Hall factor than holes by almost two times [15]. An extended expression for modeling Hall mobility can be expressed by [16]:…”
Section: Magfet Fundamentals and Proposed Complementary Differential mentioning
confidence: 99%
“…1. Using the strip technique [9], a 45-µm-width double-metal strip carries the current to be sensed. In this version, the current range increases up to 500 mA, as allowed by the metal thickness available in the 0.35 µm CMOS technology.…”
Section: Implemented Current Sensorsmentioning
confidence: 99%