Separating temperature effects from ring-oscillator readings to measure true IR-drop on a chip

Abuhamdeh, Z.; D'Alassandro, V.; Pico, Roger Pita; Montrone, D.; Crouch, Alfred L.; Tracy, Allen J.

doi:10.1109/test.2007.4437591

Cited by 19 publications

(6 citation statements)

References 15 publications

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“…For example, a voltage reference [155] or IR drop sensor [156] may be made temperature insensitive to improve the accuracy of a sensor reading. temperature variations on the ring oscillator, allowing for improved accuracy in voltage measurements.…”

Section: Temperature Sensitivity Adjustment For Improved Sensor Accuracymentioning

confidence: 99%

Managing Temperature Effects in Nanoscale Adaptive Systems

Wolpert

Ampadu

2012

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Section: Temperature Sensitivity Adjustment For Improved Sensor Accuracymentioning

confidence: 99%

Managing Temperature Effects in Nanoscale Adaptive Systems

Wolpert

Ampadu

2012

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“…It is quite common that Ring-Oscillators (RO) are used as monitors for the measuring the effects of Process, VDD voltage, Temperature, and Ageing (or jointly called PVTA effects) [15]- [19]. Fig.…”

Section: Preliminariesmentioning

confidence: 99%

Cloud-Based Online Ageing Monitoring for IoT Devices

2019

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Reliability of an electronic device, concerning if it can function reliably over its designated lifetime in the field (such as 10 or 15 years), has become more and more important in today's safety-critical applications such as automotive electronics. Traditionally, the ageing has been performed in an offline setting where stress test has been applied to accelerate the ageing process and then a model is established to make the futuristic prediction. This kind of offline method has a drawback of not being able to take into account the factor of the unique operating condition and environment that a device could have experienced in the field. In this work, we present the first cloud-based ageing monitoring system to the best of our knowledge, for the Internet-of-Things (IoT) devices. It has many advantages. First of all, one can know of the ageing status of an IoT device remotely and continuously. Secondly, through data analysis in a cloud server, more accurate prediction can be achieved. Thirdly, an ageing hazard can be alarmed in advance before it actually strikes, and thereby precaution actions (such as online repair, or even call-for-maintenance request) can be taken in advance to avoid unnecessary system fatal failure. A prototype system using test chips with builtin design-for-ageing-monitoring circuitry will be demonstrated with measurement data collected through a cloud server. INDEX TERMS Ageing monitoring, reliability, Internet of Things, stress test, ring oscillator.

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“…Figure 2 shows the chip-package PDN model with the static IR-drop measurement circuit. In previous work, an RO circuit is used as an ADC which translates supply voltages to oscillation frequencies [10], [11], [12]. An RO has high sensitivity to supply voltage, and it has high sensitivity to process variation and temperature variation.…”

Section: Requirements For Ir-drop Measurement Circuitmentioning

confidence: 99%

A Ring Oscillator With Calibration Circuit for On-Chip Measurement of Static IR-drop

Nishizawa

Onodera

2013

IEEE Trans. Semicond. Manufact.

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Resource estimation of a power distribution network (PDN) is a critical issue for the resource management of LSIs. To evaluate the impact of PDN parameters to the quality of power delivery, an accurate PDN simulation model is necessary. To reflect the real silicon's behavior to PDN simulation models, we propose a test structure that consists of an array of Ring Oscillators (ROs) with calibration circuits for static IR-drop measurement. The calibration circuit is used for the estimation of the RO frequency without any IR-drops so that we can estimate the absolute value of the IR-drop under circuit operation. A test chip which includes 540 ROs and 270 calibration circuits is fabricated in a 65 nm process. The maximum discrepancy between the measurement and simulation values is 0.18% in standby mode, and 0.76% for additional current loading mode. Index Terms-Power distribution network (PDN), IR-drop, Ring Oscillator (RO).

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Separating temperature effects from ring-oscillator readings to measure true IR-drop on a chip

Cited by 19 publications

References 15 publications

Managing Temperature Effects in Nanoscale Adaptive Systems

Managing Temperature Effects in Nanoscale Adaptive Systems

Cloud-Based Online Ageing Monitoring for IoT Devices

A Ring Oscillator With Calibration Circuit for On-Chip Measurement of Static IR-drop

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