Secondary electron emission coefficient of a MgO single crystal

Abstract

Influence of duty cycle on the structure and secondary electron emission properties of MgO films deposited by pulsed mid-frequency magnetron sputtering Electron ejection from MgO thin films by low energy noble gas ions: Energy dependence and initial instability of the secondary electron emission coefficient

Secondary electron emission and glow discharge properties of 12CaO·7Al2O3electride for fluorescent lamp applications

“…The cathode fall voltage is known to be closely related to γ , which was treated theoretically in references [39,44] and evaluated experimentally in this study, using the C12A7 electride. Figure 3 shows the setup used for measuring γ in this study [32][33][34][35][45][46][47][48][49]. It consists of a vacuum chamber, an ion gun and an electrode to collect the emitted electrons.…”

Fabrication techniques and material properties of dielectric MgO thin films—A status review

“…The increase of O 2 flow rate results an increase of d. Recently, Choi et al [189] studied the work functions and d coefficients of h1 1 1i, h1 0 0i and h1 1 0i surfaces of MgO and established that the h1 1 1i surface has the lowest work function, corresponding to a maximum kinetic energy of the ejected secondary electrons from the MgO films [190][191][192] and therefore observed a higher d coefficient. In addition, it has been reported that defects in the films could trap the excited secondary electrons leading to a decrease of the amount of the secondary electrons escaping from film surface and therefore to decrease of d. Cheng et al [149] reported that the d coefficient increases with increasing E/P, where E is the applied field and P is the pressure between the cells.…”

Two‐DimensionalKinetic and Three‐Dimensional Fluid‐Radiation Transport Simulations of Plasma Display Panel

“…There have been many experiments and theoretical approaches to find the SEEC of MgO or other protective materials [5][6][7]. However, these experiments or theories present different SEEC values.…”