Search for an optimum time response of spark counters

From binomial distribution of electron occurrence to Gauss and Gauss-exponential distribution of the statistical time delay: Analytical transition and simulations

“…Searching for an optimum time response function of spark counters changing voltage, content of noble and quencher gases, pressure and energy loss has brought an improvement of the resolution and a significant reduction of tails in the time response function [24]. For a quantitative parameterization of the measured time response function the composition of two distributions were used, on the left of the transition maximum two Gaussian distributions are used, while on the right of the transition maximum a Gaussian function with an exponential tail is fitted to the data [24], with an unphysical knee at the transition maximum. Reliability is a key issue for memory devices as data corruption lead to system failure, especially in the presence of intense radiation sources.…”

Determination of correlation coefficient of the statistical and formative time delay in nitrogen

“…The complex structure of the breakdown time delay distributions was observed in the transient hollow cathode discharges [7], since the formative time delay has small fluctuations and a large mean value, while the statistical time delay has a small mean value and large fluctuations. Also, the minimization and control of the breakdown time delay are relevant to some other applications, such as spark counters [8], ECR ion sources [9] or micro-discharges [10]. An attempt to separate the formative and statistical time delay in neon and krypton was made in [11][12][13][14][15], on the basis of the time delay measurements, numerical simulation and by irradiation.…”