Scanning near-field optic/atomic-force microscopy

Growth of dark spots by interdiffusion across organic layers in organic electroluminescent devices

“…To confirm the interdiffusion in the dark spots, we measured local fluorescence spectra of the dark spots by using SNOM-AFM 14,15 as shown in an inset of Fig. 3 and compared the spectra with those of mixed model films measured similarly with SNOM-AFM.…”

Preparation of Self‐assembled Monolayers (SAMs) onAuandAg

“…In addition to STM and AFM, scanning near-field optical microscopy (SNOM), which is also called near-field scanning optical microscopy (NSOM), was found to be useful for optical patterning of SAMs [292]. By controlling tip-sample separation of SNOM by AFM [293][294][295], optical patterning was readily achieved [292]. The readers interested in near-field optical microscopic manipulation and a local optical observation should be referred to a review article [296].…”

Review of near-field optical microscopy

“…Pohl et al [5], Betzig et al [6], Dürig et al [7] and Muramatsu et al [8] developed the early A-SNOM in 1985 1987. Betzig [9] invented the shearforce mode A-SNOM on constant-distance scanning, where fiber tip is resonant laterally in the near-field of the surface of sample in 1987.…”