1989
DOI: 10.1109/33.49047
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Scaling, subthreshold, and leakage current matching characteristics in high-temperature (25 degrees C-250 degrees C) VLSI CMOS devices

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Cited by 28 publications
(14 citation statements)
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“…Although such circuits were shown operational at very high temperature, they suffered from significant voltage droop during the hold phase due to increased switch leakage current. This prompted a rejection of switched-capacitor circuits for high resolution applications, due to a perceived resolution-speed tradeoff [11]. However, the use of fully differential switched-capacitor circuits for high-temperature operation was not addressed.…”
Section: Introductionmentioning
confidence: 98%
See 1 more Smart Citation
“…Although such circuits were shown operational at very high temperature, they suffered from significant voltage droop during the hold phase due to increased switch leakage current. This prompted a rejection of switched-capacitor circuits for high resolution applications, due to a perceived resolution-speed tradeoff [11]. However, the use of fully differential switched-capacitor circuits for high-temperature operation was not addressed.…”
Section: Introductionmentioning
confidence: 98%
“…Insulated technologies prevent the reverse-biased diode leakage current that is problematic to designs in standard CMOS at high temperatures, as will be discussed. In standard CMOS, switched-capacitor circuits have been shown to be operational to temperatures as high as 275 C [4], [11]. Although such circuits were shown operational at very high temperature, they suffered from significant voltage droop during the hold phase due to increased switch leakage current.…”
Section: Introductionmentioning
confidence: 99%
“…The bandwidth can be expressed as BW = ω p (1+βA v ), where ω p is the 3-dB frequency and β is the feedback factor. Furthermore, the increased temperature reduces the bandwidth [15,16]. The amplifier achieves an integrated noise of less than 2 µV rms over the temperature range from −5 • C to 45 • C. The IRN of the CCIA, V 2 n,in , can be expressed as…”
Section: Circuit Implementationmentioning
confidence: 99%
“…2 [7]. Higher temperatures lead to a breakdown of the pn-junction between well and substrate and consequently of the sensor.…”
Section: Introductionmentioning
confidence: 97%