2021
DOI: 10.1021/acsami.1c14091
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Scalable Characterization of 2D Gallium-Intercalated Epitaxial Graphene

Abstract: Scalable synthesis of two-dimensional gallium (2D-Ga) covered by graphene layers was recently realized through confinement heteroepitaxy using silicon carbide substrates. However, the thickness, uniformity, and area coverage of the 2D-Ga heterostructures have not previously been studied with high-spatial resolution techniques. In this work, we resolve and measure the 2D-Ga heterostructure thicknesses using scanning electron microscopy (SEM). Utilizing multiple correlative methods, we find that SEM image contra… Show more

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Cited by 6 publications
(12 citation statements)
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“…Confocal laser scanning Raman microscopy can realize identification of graphene and copper oxides with the spatial resolution of B1 mm; however, Raman microscopy is not applicable for the thin interfacial oxide layer of Gr/Cu with thickness down to a few nanometers, and it may be time intensive for mapping measurements though it offers fast characterization for single point measurement. Focused ion beam-transmission electron microscopy (FIB-TEM) and high resolution transmission electron microscopy (HRTEM) can be used to characterize the thickness and morphology of interfacial oxide layers 30,31 at nanoand even atomic-scale; however, statistically reliable information can only be acquired by imaging at multiple regions for heterogeneous interfaces.…”
Section: Introductionmentioning
confidence: 99%
“…Confocal laser scanning Raman microscopy can realize identification of graphene and copper oxides with the spatial resolution of B1 mm; however, Raman microscopy is not applicable for the thin interfacial oxide layer of Gr/Cu with thickness down to a few nanometers, and it may be time intensive for mapping measurements though it offers fast characterization for single point measurement. Focused ion beam-transmission electron microscopy (FIB-TEM) and high resolution transmission electron microscopy (HRTEM) can be used to characterize the thickness and morphology of interfacial oxide layers 30,31 at nanoand even atomic-scale; however, statistically reliable information can only be acquired by imaging at multiple regions for heterogeneous interfaces.…”
Section: Introductionmentioning
confidence: 99%
“…The AES maps were acquired using JEOL JAMP-9500F at 10 kV, 10−20 nA, and <10 −6 mbar where the Auger electrons are analyzed using a hemispherical analyzer equipped with a seven-channel detector. Here we utilize correlative microscopy workflows to reveal that the 2D-Ga regions has an oxygen signal but locates above the metal in cross-section viewwithout actual oxidation of the 2D-Ga. By preparing a site-specific cross-section from the 2D-Ga surface [2], we could employ aberration-corrected scanning transmission electron microscopy (STEM) and electron energy loss spectroscopy (EELS) investigations to understand the role of bilayer graphene in protecting the 2D-Ga.…”
mentioning
confidence: 99%
“…2a,b. Identifying this site and its contents is possible using the SEM contrast as previously studied [2]. A double-corrected FEI Titan STEM (operated at 200 keV and 50-100 nA screen current) is used to acquire high annular angle dark field (HAADF) images from both the peeled and unpeeled regions in the cross-section view.…”
mentioning
confidence: 99%
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“…Although the EG is deliberately damaged using plasma to open intercalation holes prior to the CHet process, the EG is found to be healed after the metal intercalation due to a metal catalytic effect. The CHet process facilitates scalable and environmentally air-stable 2D metals and alloys over millimeter-scale [2,3]. CHet metals and alloys exhibit novel properties, such as enormous second harmonic generation [4], superconductivity [1], and epsilonnear-zero behavior [5].…”
mentioning
confidence: 99%