Compound Semiconductors 1997. Proceedings of the IEEE Twenty-Fourth International Symposium on Compound Semiconductors 1997
DOI: 10.1109/iscs.1998.711689
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Saturation charge storage measurements in GaInP/GaAs/GaAs and GaInP/GaAs/GaInP HBTs

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Cited by 6 publications
(2 citation statements)
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“…To achieve highefficiency it is necessary to minimize charge storage during transistor saturation (in the ON state). This can be achieved using double-heterojunction bipolar transistors (DHBT's) with wide bandgap collectors such as those reported in [6]. Fig.…”
Section: Amplifier Configurationmentioning
confidence: 99%
“…To achieve highefficiency it is necessary to minimize charge storage during transistor saturation (in the ON state). This can be achieved using double-heterojunction bipolar transistors (DHBT's) with wide bandgap collectors such as those reported in [6]. Fig.…”
Section: Amplifier Configurationmentioning
confidence: 99%
“…These disadvantages can be improved by replacing the InGaAs collector with an InP layer [8]. However, the electron blocking effect resulting from the conduction band discontinuity ( E C ) at a base-collector (BC) heterojunction will lead to detrimental 0268-1242/04/070864+06$30.00 © 2004 IOP Publishing Ltd Printed in the UK influences such as reduced current gain, increased saturation voltage and extra charge storage [8,9]. In this work, the InP/InGaAs single-and double-heterojunction bipolar transistors, denoted as SHBT and DHBT, respectively, with an InP tunnelling barrier between the InGaAs emitter and base, similar to the TEBT structure mentioned above, are fabricated and demonstrated.…”
Section: Introductionmentioning
confidence: 99%