Abstract:Scattering characteristics of multilayer fluoride coatings for 193 nm deposited by ion beam sputtering and the related interfacial roughnesses are investigated. Quarter-and half-wave stacks of MgF 2 and LaF 3 with increasing thickness are deposited onto CaF 2 and fused silica and are systematically characterized. Roughness measurements carried out by atomic force microscopy reveal the evolution of the power spectral densities of the interfaces with coating thickness. Backward-scattering measurements are presen… Show more
“…In contrast, PSD data obtained from electropolished materials typically do not exhibit straight lines on a log/log plot but display two regions of strong curvature, as will be seen later. More generally, the PSD of a niobium surface prepared by various methods can be fruitfully decomposed into contributions from each of these types of models [22,26,[35][36][37]:…”
Surface topography characterization is a continuing issue for the superconducting radio frequency (SRF) particle accelerator community. Efforts are under way to both improve surface topography and its characterization and analysis using various techniques. In measurement of topography, power spectral density (PSD) is a promising method to quantify typical surface parameters and develop scale-specific interpretations. PSD can also be used to indicate how the process modifies topography at different scales. However, generating an accurate and meaningful topographic PSD of an SRF surface requires careful analysis and optimization. In this report, niobium surfaces with different process histories are sampled with atomic force microscopy and stylus profilometry and analyzed to trace topography evolution at different scales. An optimized PSD analysis protocol to serve SRF needs is presented.
“…In contrast, PSD data obtained from electropolished materials typically do not exhibit straight lines on a log/log plot but display two regions of strong curvature, as will be seen later. More generally, the PSD of a niobium surface prepared by various methods can be fruitfully decomposed into contributions from each of these types of models [22,26,[35][36][37]:…”
Surface topography characterization is a continuing issue for the superconducting radio frequency (SRF) particle accelerator community. Efforts are under way to both improve surface topography and its characterization and analysis using various techniques. In measurement of topography, power spectral density (PSD) is a promising method to quantify typical surface parameters and develop scale-specific interpretations. PSD can also be used to indicate how the process modifies topography at different scales. However, generating an accurate and meaningful topographic PSD of an SRF surface requires careful analysis and optimization. In this report, niobium surfaces with different process histories are sampled with atomic force microscopy and stylus profilometry and analyzed to trace topography evolution at different scales. An optimized PSD analysis protocol to serve SRF needs is presented.
“…The first two parameters (K, scaling factor; n, slope 1) correspond to the fractal model (adequate for most substrates). They are similar for the three samples, although the substrate and coating material of sample C differ from 23 It seems that gold tends to form slightly smoother coatings than titanium nitride and k corr is a measure of the grain size. Both coatings have a grain size of ¾40-50 nm.…”
Section: Obtaining Objective Information From Combined Psdmentioning
confidence: 86%
“…A more detailed description of our approach of the combined-model PSD can be found in Ref. 23. Figure 5 shows an example of this fitting procedure.…”
Section: Obtaining Objective Information From Combined Psdmentioning
We present a method for extending the capabilities of scanning probe microscopy (SPM) methods in surface engineering by specific processing and interpretation of topographic data. The first part of this processing permits SPM measurements of different scan sizes to be combined with other microtopographical techniques. The result is a comprehensive description of the surface microstructure based on power spectral density functions. The second part consists of the extraction of a small set of characteristic parameters that objectively characterize the statistical properties of the surface and separate different roughness contributions
“…However, it has been observed that several coatings show the formation of superstructures uniformly distributed along the surface. 23,24 This induces a local maximum in the lower frequencies of the PSD that cannot be described satisfactorily by any of the previous models. An example is represented by the PSD of Fig.…”
Section: A Overview Of Models Applied In Surface Characterizationmentioning
confidence: 92%
“…The results of this study have been published elsewhere. 23,24 Table 2 summarizes the produced designs, where the thickness units are optical quarter-waves and the design wavelength is 193 nm. MgF 2 and LaF 3 were used as the low-and high-index materials, respectively.…”
Section: A Atomic Force Microscope Measurements and Calculation Of Ementioning
A method for characterizing the microroughness of samples in optical coating technology is developed. Measurements over different spatial-frequency ranges are composed into a single power spectral density ͑PSD͒ covering a large bandwidth. This is followed by the extraction of characteristic parameters through fitting of the PSD to a suitable combination of theoretical models. The method allows us to combine microroughness measurements performed with different techniques, and the fitting procedure can be adapted to any behavior of a combined PSD. The method has been applied to a set of ion-beamsputtered fluoride vacuum-UV coatings with increasing number of alternative low-and high-index layers. Conclusions about roughness development and microstructural growth are drawn.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.