Rotatable broadband retarders for far-infrared spectroscopic ellipsometry

Kang, Tae Sun; Standard, E. C.; Carr, G. L.; Zhou, Tao; Kotelyanskii, Michael; Sirenko, A. A.

doi:10.1016/j.tsf.2010.12.057

Cited by 13 publications

(13 citation statements)

References 6 publications

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“…In Ref. 3 we demonstrated that if fast focusing with f # < 10 is used, then the state of polarization after passing an optical retarder has a significant uncertainty that may result in detrimental errors in MM-SE experiments.…”

Section: Linear Polarizers Retarders and Light Focusingmentioning

confidence: 99%

“…Preliminary results of this development effort were published in Ref. 3. Multiple conditions have been met in this design, such as (i) a reasonably high transmission in the operating frequency range and (ii) minimal displacement of the beam caused by the 360 • retarder rotation around its optical axis.…”

Section: Linear Polarizers Retarders and Light Focusingmentioning

confidence: 99%

“…The principles of the rotatable broadband optical retarders are published in Ref. 3. Several important aspects for analysis of the optical spectra for samples with the magnetic permeability μ = 1 are summarized in Ref.…”

Section: Introductionmentioning

confidence: 99%

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Synchrotron radiation-based far-infrared spectroscopic ellipsometer with full Mueller-matrix capability

Stanislavchuk

Kang

Rogers

et al. 2013

Review of Scientific Instruments

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We developed far-IR spectroscopic ellipsometer at the U4IR beamline of the National Synchrotron Light Source in Brookhaven National Laboratory. This ellipsometer is able to measure both, rotating analyzer and full-Mueller matrix spectra using rotating retarders, and wire-grid linear polarizers. We utilize exceptional brightness of synchrotron radiation in the broad spectral range between about 20 and 4000 cm(-1). Fourier-transform infrared (FT-IR) spectrometer is used for multi-wavelength data acquisition. The sample stage has temperature variation between 4.2 and 450 K, wide range of θ-2θ angular rotation, χ tilt angle adjustment, and X-Y-Z translation. A LabVIEW-based software controls the motors, sample temperature, and FT-IR spectrometer and also allows to run fully automated experiments with pre-programmed measurement schedules. Data analysis is based on Berreman's 4 × 4 propagation matrix formalism to calculate the Mueller matrix parameters of anisotropic samples with magnetic permeability μ ≠ 1. A nonlinear regression of the rotating analyzer ellipsometry and∕or Mueller matrix (MM) spectra, which are usually acquired at variable angles of incidence and sample crystallographic orientations, allows extraction of dielectric constant and magnetic permeability tensors for bulk and thin-film samples. Applications of this ellipsometer setup for multiferroic and ferrimagnetic materials with μ ≠ 1 are illustrated with experimental results and simulations for TbMnO3 and Dy3Fe5O12 single crystals. We demonstrate how magnetic and electric dipoles, such as magnons and phonons, can be distinguished from a single MM measurement without adducing any modeling arguments. The parameters of magnetoelectric components of electromagnon excitations are determined using MM spectra of TbMnO3.

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Section: Linear Polarizers Retarders and Light Focusingmentioning

confidence: 99%

Section: Linear Polarizers Retarders and Light Focusingmentioning

confidence: 99%

See 1 more Smart Citation

Synchrotron radiation-based far-infrared spectroscopic ellipsometer with full Mueller-matrix capability

Stanislavchuk

Kang

Rogers

et al. 2013

Review of Scientific Instruments

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“…Based on these considerations we have chosen high-resistivity silicon (refractive index n = 3.42 in the far infrared) for our retarder. A double-Fresnel rhomb design [ Figure 1(a)] using silicon was proposed by two of us for a far-infrared full Mueller Matrix ellipsometry [21,22]. A consequence of the high refractive index is a rather large phase shift for a single internal reflection.…”

Section: Operating Principle and Designmentioning

confidence: 99%

A broadband silicon quarter-wave retarder for far-infrared spectroscopic circular dichroism

Smith

Stanislavchuk

et al. 2014

Infrared Physics & Technology

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h i g h l i g h t sWe describe the design of a silicon quarter retarder working in the far infrared. The device produces far-infrared light with a high degree of circular polarization. We demonstrate its performance by photo-induced magnetospectroscopy of GaAs. 1 4 wave retarder Circularly polarized light Circular dichroism Far-infrared magnetospectroscopy Cyclotron resonance Excitons a b s t r a c tThe high brightness, broad spectral coverage and pulsed characteristics of infrared synchrotron radiation enable time-resolved spectroscopy under throughput-limited optical systems, as can occur with the highfield magnet cryostat systems used to study electron dynamics and cyclotron resonance by far-infrared techniques. A natural extension for magnetospectroscopy is to sense circular dichroism, i.e. the difference in a material's optical response for left and right circularly polarized light. A key component for spectroscopic circular dichroism is an achromatic 1 4 wave retarder functioning over the spectral range of interest. We report here the development of an in-line retarder using total internal reflection in high-resistivity silicon. We demonstrate its performance by distinguishing electronic excitations of differing handedness for GaAs in a magnetic field. This 1 4 wave retarder is expected to be useful for far-infrared spectroscopy of circular dichroism in many materials.

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“…A challenge in the implementation of MM-SE in the THz regime has been in obtaining broadband circularly polarized light as broadband retarders for this spectral range are not commercially available. The BNL group has developed rotating retarders based on triangular prisms or double Fresnel rhombs [52]. Multi- The difference spectra are obtained as the difference between fields µ 0 H = 4 T and 0 T in order to emphasize the field induced changes on the Mueller matrix elements.…”

Section: Far Infrared Ellipsometry Using Synchrotron Based Sourcesmentioning

confidence: 99%

Developments in THz Range Ellipsometry

Neshat

Armitage

2013

J Infrared Milli Terahz Waves

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Ellipsometry is a technique whereby the measurement of the two orthogonal polarization components of light reflected at glancing incidence allows a characterization of the optical properties of a material at a particular frequency. Importantly, it obviates the need for measurement against a standard reference sample, and so can provide reliable spectroscopic information even when surface morphology is unknown, of marginal quality and/or a reference is unavailable. Although a standard technique in the visible range, it has not been widely applied in the Terahertz (THz) spectral range despite its potential utility. This is largely because of the technical difficulties that these frequencies present. This review details recent progress in the implementation of THz range ellipsometry. We discuss a variety of configurations including various kinds of laboratory and facility based sources using both continuous wave and pulsed spectroscopic methods. We discuss the general problems encountered when trying to import the methodologies of visible range ellipsometry to the THz range and give examples of where the technique has been successful thus far.

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Rotatable broadband retarders for far-infrared spectroscopic ellipsometry

Cited by 13 publications

References 6 publications

Synchrotron radiation-based far-infrared spectroscopic ellipsometer with full Mueller-matrix capability

Synchrotron radiation-based far-infrared spectroscopic ellipsometer with full Mueller-matrix capability

A broadband silicon quarter-wave retarder for far-infrared spectroscopic circular dichroism

Developments in THz Range Ellipsometry

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