2013
DOI: 10.1063/1.4789495
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Synchrotron radiation-based far-infrared spectroscopic ellipsometer with full Mueller-matrix capability

Abstract: We developed far-IR spectroscopic ellipsometer at the U4IR beamline of the National Synchrotron Light Source in Brookhaven National Laboratory. This ellipsometer is able to measure both, rotating analyzer and full-Mueller matrix spectra using rotating retarders, and wire-grid linear polarizers. We utilize exceptional brightness of synchrotron radiation in the broad spectral range between about 20 and 4000 cm(-1). Fourier-transform infrared (FT-IR) spectrometer is used for multi-wavelength data acquisition. The… Show more

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Cited by 31 publications
(16 citation statements)
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References 82 publications
(90 reference statements)
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“…The experimental temperature dependencies of the LF and KK excitations in Dy-IG ( Fig. 3) are similar to that for antiferromagnetic resonances, or magnons at ⃗ k ¼ 0, in the magnetically ordered system with several interacting spins [39][40][41]. Interaction of the LF and KK modes in Dy-IG with vortex optical beams is the main focus of our experiments.…”
supporting
confidence: 65%
“…The experimental temperature dependencies of the LF and KK excitations in Dy-IG ( Fig. 3) are similar to that for antiferromagnetic resonances, or magnons at ⃗ k ¼ 0, in the magnetically ordered system with several interacting spins [39][40][41]. Interaction of the LF and KK modes in Dy-IG with vortex optical beams is the main focus of our experiments.…”
supporting
confidence: 65%
“…Samples with dimensions up to 5x5x10 mm were oriented using the crystal morphology and optical (2 -300 K). FIR ellipsometry measurements were also performed, using self-made ellipsometer on the U4IR beamline of the National Synchrotron Light Source, Brookhaven National Laboratory, USA [26]. Raman measurements were performed in a backscattering configuration, as described in Ref.…”
Section: Methodsmentioning
confidence: 99%
“…Experimental details can be found in Refs. [30,31]. The complex dielectric functionεðωÞ ¼ ε 1 ðωÞ þ iε 2 ðωÞ and the related optical conductivity σ 1 ðωÞ ¼ ωε 2 ðωÞ=ð4πÞ were determined by direct inversion of the Fresnel equations from the ellipsometric parameters ΨðωÞ and ΔðωÞ.…”
mentioning
confidence: 99%