2002
DOI: 10.1016/s0921-5107(02)00380-x
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Room temperature photoreflectance of different electron concentration GaN epitaxial layers

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Cited by 10 publications
(12 citation statements)
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“…Features labeled A, B, and C are related to the [20], respectively. The character of these transitions for a high quality GaN layer, such as the sample SR, is mainly excitonic [21,22] due to the high exciton binding energy, ∼26 meV. In the case of PR obtained for HFET structures, transitions originating from both GaN and AlGaN layers are very well visible.…”
Section: Resultsmentioning
confidence: 91%
“…Features labeled A, B, and C are related to the [20], respectively. The character of these transitions for a high quality GaN layer, such as the sample SR, is mainly excitonic [21,22] due to the high exciton binding energy, ∼26 meV. In the case of PR obtained for HFET structures, transitions originating from both GaN and AlGaN layers are very well visible.…”
Section: Resultsmentioning
confidence: 91%
“…We have observed that the broadening of the bandgap-related peak is not influenced by the increase in Mg concentration, and the broadening is ~45 meV for each sample. Such broadening is typical for high quality GaN layers [10], and indicates that the incorporation of Mg atoms does not deteriorate the structural quality of the sample.…”
Section: Methodsmentioning
confidence: 81%
“…In the case of the reference sample SR, we have observed PR features typical for nominally undoped GaN layers, i.e. n-type GaN [10,11,13]. The features labeled A, B, and C are related to the [20], respectively.…”
Section: Methodsmentioning
confidence: 88%
“…The features labeled A, B, and C are related to the [20], respectively. The character of these transitions for a high quality GaN layer, such as the sample SR, is mainly excitonic [11,13] due to the high exciton binding energy ∼26 meV. In the case of GaN:Mg layers the PR spectra are completely different from the PR spectrum obtained for the reference sample SR.…”
Section: Methodsmentioning
confidence: 91%
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