1999
DOI: 10.1063/1.124638
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Room-temperature photopumped InGaN/GaN/AlGaN vertical-cavity surface-emitting laser

Abstract: We report photopumped room-temperature surface-mode lasing at 401 nm in a InGaAlN vertical-cavity surface-emitting laser grown on a sapphire substrate using metal–organic vapor-phase epitaxy. A 2λ cavity was formed by a quarter-wave Al0.15Ga0.85N/GaN distributed Bragg reflector on the one side of the active layer and a GaN–air interface on the other. A multilayer structure composed of 12-fold-stacked ultrathin InGaN insertions in a GaN matrix served as an active layer providing ultrahigh material gain and maki… Show more

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Cited by 85 publications
(39 citation statements)
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“…[2] and [3], we estimate that the threshold conditions in Fig. 2 are orders of magnitude lower than we can surmise from those reports.…”
Section: Resultscontrasting
confidence: 50%
See 1 more Smart Citation
“…[2] and [3], we estimate that the threshold conditions in Fig. 2 are orders of magnitude lower than we can surmise from those reports.…”
Section: Resultscontrasting
confidence: 50%
“…Recently, two groups have reported vertical cavity, or ªsurface lasingº in structures that incorporate AlGaN-based DBR mirrors, under pulsed, low duty cycle ( 10 Hz) intense optical pumping [2,3]. We wish to underscore that observations such as those in Fig.…”
Section: Resultsmentioning
confidence: 92%
“…High crystal perfection of the epilayers allowed us to use them as buffers for strain-compensated AlGaN/ GaN distributed Bragg reflectors with high reflectivity [2] served as bottom mirror for photopumped RT operated InGaN/GaN/AlGaN VCSELs [3]. …”
Section: Discussionmentioning
confidence: 99%
“…In addition, the high absorption coefficient of silicon degrades the performance of LED grown on it. Although the high-reflectivity AlN / GaN (99%) distributed Bragg reflectors (DBRs) can resolve this problem [3], large mismatch between AlN and GaN (~2.5%) along with the tensile stress from silicon substrate make it much more difficult to grow desired DBRs over silicon [4]. We use a set of nine period AlN / GaN short-period superlattices (SL) with average Al content of 50% instead of the bulk Al 0.5 Ga 0.5 N.…”
Section: Introductionmentioning
confidence: 99%