1999
DOI: 10.1002/(sici)1521-3951(199911)216:1<381::aid-pssb381>3.0.co;2-o
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Role of Spontaneous and Piezoelectric Polarization Induced Effects in Group-III Nitride Based Heterostructures and Devices

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Cited by 128 publications
(59 citation statements)
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“…2 In addition, the lattice mismatch between GaN and InGaN will induce the piezoelectric field in the InGaN layer and lead to quantum-confined Stark effect (QCSE). 3 The QCSE separates electron and hole wavefunctions which reduces the radiative recombination efficiency, and TDs can act as a carrier leakage path to influence the device reliability as well. 4,5 Besides, TDs are the nonradiative recombination centers which trap carriers and reduce the internal quantum efficiency (IQE).…”
Section: Introductionmentioning
confidence: 99%
“…2 In addition, the lattice mismatch between GaN and InGaN will induce the piezoelectric field in the InGaN layer and lead to quantum-confined Stark effect (QCSE). 3 The QCSE separates electron and hole wavefunctions which reduces the radiative recombination efficiency, and TDs can act as a carrier leakage path to influence the device reliability as well. 4,5 Besides, TDs are the nonradiative recombination centers which trap carriers and reduce the internal quantum efficiency (IQE).…”
Section: Introductionmentioning
confidence: 99%
“…1 and 2) owing to the large difference in spontaneous polarization at the interface. 3 High-performance InAlN/GaN high-electron-mobility transistors (HEMTs) have been fabricated and reported. 2,4 To suppress the gate leakage current through the InAlN gate barrier in the application of InAlN/GaN heterostructures to HEMTs, the use of Al 2 O 3 to form a metal-insulator-semiconductor (MIS)-gate HEMT has been reported.…”
mentioning
confidence: 99%
“…The average electric field was calculated by taking into account spontaneous and piezoelectric polarization [22,25,26], built-in electric field due to the Schottky contact and applied field between the contacts. If a MQW structure is incorporated in the intrinsic region of Schottky diode, it leads to the following expression [27] …”
Section: Models and Discussionmentioning
confidence: 99%